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    Low cost soft error hardened latch designs for nano-scale CMOS technology in presence of process variation

    , Article Microelectronics Reliability ; Volume 53, Issue 6 , June , 2013 , Pages 912-924 ; 00262714 (ISSN) Rajaei, R ; Tabandeh, M ; Fazeli, M ; Sharif University of Technology
    2013
    Abstract
    In this paper, two Low cost and Soft Error Hardened latches (referred to as LSEH1 and LSEH2) are proposed and evaluated. The proposed latches are fully SEU immune, i.e. they are capable of tolerating all particle strikes to any of their nodes. Moreover, they can mask Single Event Transients (SETs) occurring in combinational logics and reaching the input of the latches. We have compared our SEU/SET-tolerant latches with some well-known previously proposed soft error tolerant latches. To evaluate the proposed latches, we have done a set of SPICE simulations. The simulation results trough comparisons with other hardened latches reveal that the proposed latches not only have more robustness but... 

    A combinational logic optimization for majority gate-based nanoelectronic circuits based on GA

    , Article 2011 International Semiconductor Device Research Symposium, ISDRS 2011, College Park, MD, 7 December 2011 through 9 December 2011 ; 2011 ; 9781457717550 (ISBN) Roohi, A ; Kamrani, M ; Sayedsalehi, S ; Navi, K ; Sharif University of Technology
    Abstract
    Quantum dots cellular automata is a new computing method in the nanotechnology that has considerable features such as low power, small dimension and high speed switch. A QCA device stores logic based on the position of individual electrons. The fundamental logic elements in QCA are the majority (Fig.1 (a)) and inverter gates (Fig.1 (b)) that operate based on the Coulomb repulsion between electrons [1]  

    Fast reliability analysis method for sequential logic circuits

    , Article Proceedings - ICSEng 2011: International Conference on Systems Engineering, 16 August 2011 through 18 August 2011, Las Vegas, NV ; 2011 , Pages 352-356 ; 9780769544953 (ISBN) Mohammadi, K ; Jahanirad, H ; Attarsharghi, P ; Sharif University of Technology
    2011
    Abstract
    Reliability analysis of combinational logic circuits using error probabilities methods, such as PTM, has been widely developed and used in literature. However, using these methods for reliability analysis of sequential logic circuits will lead to inaccurate results, because of existence of loops in their architecture. In this paper a new method is proposed based on converting the sequential circuit to a secondary combinational circuit and applying an iterative reliability analysis to the resulting configuration. Experimental results demonstrate good accuracy levels for this method  

    Soft error modeling and remediation techniques in ASIC designs

    , Article Microelectronics Journal ; Volume 41, Issue 8 , August , 2010 , Pages 506-522 ; 00262692 (ISSN) Asadi, H ; Tahoori, M. B ; Sharif University of Technology
    2010
    Abstract
    Soft errors due to cosmic radiations are the main reliability threat during lifetime operation of digital systems. Fast and accurate estimation of soft error rate (SER) is essential in obtaining the reliability parameters of a digital system in order to balance reliability, performance, and cost of the system. Previous techniques for SER estimation are mainly based on fault injection and random simulations. In this paper, we present an analytical SER modeling technique for ASIC designs that can significantly reduce SER estimation time while achieving very high accuracy. This technique can be used for both combinational and sequential circuits. We also present an approach to obtain... 

    An efficient fast switching procedure for stepwise capacitor chargers

    , Article IEEE Transactions on Very Large Scale Integration (VLSI) Systems ; Volume 25, Issue 2 , 2017 , Pages 705-713 ; 10638210 (ISSN) Khorami, A ; Sharifkhani, M ; Sharif University of Technology
    Institute of Electrical and Electronics Engineers Inc  2017
    Abstract
    A new low-power switching procedure for stepwise capacitor chargers is presented. In this procedure, a novel displacement method is utilized to improve the speed by a factor of two while preserving energy efficiency. Moreover, the load capacitor retains its charge after the charging process finishes and permits the circuit charge another predischarged load capacitor without an efficiency degradation problem (instability). Also, the control circuit of the switching procedure is implemented using only flip-flops with no combinational logic, therefore, it systematically prevents glitch power dissipation and improves the efficiency. Analytical derivations are proposed to model the switching... 

    Soft error estimation and mitigation of digital circuits by characterizing input patterns of logic gates

    , Article Microelectronics Reliability ; Vol. 54, issue. 6-7 , 2014 , p. 1412-1420 Rezaei, S ; Miremadi, S. G ; Asadi, H ; Fazeli, M ; Sharif University of Technology
    Abstract
    Soft errors caused by particles strike in combinational parts of digital circuits are a major concern in the design of reliable circuits. Several techniques have been presented to protect combinational logic and reduce the overall circuit Soft Error Rate (SER). Such techniques, however, typically come at the cost of significant area and performance overheads. This paper presents a low area and zero-delay overhead method to protect digital circuits' combinational parts against particles strike. This method is made up of a combination of two sub-methods: (1) a SER estimation method based on signal probability, called Estimation by Characterizing Input Patterns (ECIP) and (2) a protection... 

    A multi-bit error tolerant register file for a high reliable embedded processor

    , Article 2011 18th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 22011, 11 December 2011 through 14 December 2011 ; December , 2011 , Pages 532-537 ; 9781457718458 (ISBN) Esmaeeli, S ; Hosseini, M ; Vahdat, B. V ; Rashidian, B ; Sharif University of Technology
    2011
    Abstract
    The vulnerability of microprocessors to soft errors is increasing due to continuous shrinking in fabrication process. Recent studies show that 1-5% of the SEUs (single event upset) can cause MBUs (multiple bit upsets). The probability of MBU generation due to SEU is increasing because of the reduction in minimum energy required to flip a memory bit in modern technologies. Register file is the most sensitive component in a microprocessor. In this paper, we present an innovative way to protect registers in a 64-bit register file for a RISC processor using extended Hamming (8, 4) code (SEC-DED code) and narrow-width values. A narrow-width value can be represented by half number of bits of the... 

    An efficient fast switching procedure for stepwise capacitor chargers

    , Article IEEE Transactions on Very Large Scale Integration (VLSI) Systems ; Volume PP, Issue 99 , 2016 ; 10638210 (ISSN) Khorami, A ; Sharifkhani, M ; Sharif University of Technology
    Institute of Electrical and Electronics Engineers Inc 
    Abstract
    A new low-power switching procedure for stepwise capacitor chargers is presented. In this procedure, a novel displacement method is utilized to improve the speed by a factor of two while preserving energy efficiency. Moreover, the load capacitor retains its charge after the charging process finishes and permits the circuit charge another predischarged load capacitor without an efficiency degradation problem (instability). Also, the control circuit of the switching procedure is implemented using only flip-flops with no combinational logic, therefore, it systematically prevents glitch power dissipation and improves the efficiency. Analytical derivations are proposed to model the switching... 

    Determination of spermine and spermidine in meat with a ratiometric fluorescence nanoprobe and a combinational logic gate

    , Article Food Chemistry ; Volume 384 , 2022 ; 03088146 (ISSN) Abbasi-Moayed, S ; Bigdeli, A ; Hormozi Nezhad, M. R ; Sharif University of Technology
    Elsevier Ltd  2022
    Abstract
    A ratiometric fluorescent nanoprobe is developed with a wide color variation for visual determination of spermine (SP) and spermidine (SD) in meat samples. The green emission provided from the combination of yellow emissive quantum dots and blue emissive carbon dots turns into pink when SP or SD are present. The results show that the developed sensor has good linearity in the range of 0.5–10 and 0.5–80 µM for SP and SD and suitable detection limits were achieved including 0.2 and 2.1 µM for SP and SD. The probe was highly selective in the presence of amino acids and other biogenic amines. RGB indices were extracted to build a combinational logic gate for visual and simultaneous detection of...