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    From continuous to quantized charging phenomena in few nanocrystals MOS structures

    , Article 11th International Autumn Meeting on Gettering and Defect Engineering in Semiconductor Technlogy, GADEST 2005, Giens, 25 September 2005 through 30 September 2005 ; Volume 108-109 , 2005 , Pages 25-32 ; 10120394 (ISSN); 3908451132 (ISBN); 9783908451136 (ISBN) BenAssayag, G ; Shalchian, M ; Grisolia, J ; Bonafos, C ; Atarodi, S. M ; Claverie, A ; Sharif University of Technology
    Trans Tech Publications Ltd  2005
    Abstract
    In this paper, we present a study on the contribution of silicon nanocrystals to the electrical transport characteristics of large (100 μm × 100 μm) and small (100 nm × 100 nm) metaloxide-semiconductor (MOS) capacitors at room temperature. A layer of silicon nanocrystals is synthesized within the oxide of these capacitors by ultra-low energy ion implantation and annealing. Several features including negative differential resistance (NDR), sharp current peaks and random telegraph signal (RTS) are demonstrated in the current-voltage and current-time characteristics of these capacitors. These features have been associated to charge storage in silicon nanocrystals and to the resulting Coulomb... 

    Determination of transition curves for a gear system with coulomb friction

    , Article 2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006, Chicago, IL, 5 November 2006 through 10 November 2006 ; 2006 ; 01608835 (ISSN); 0791837904 (ISBN); 9780791837900 (ISBN) Saryazdi, M. Gh ; Durali, M ; Sharif University of Technology
    American Society of Mechanical Engineers (ASME)  2006
    Abstract
    This paper discusses the determination of the transition curves for a pair of spur gear with coulomb friction. Transition curves are the loci of periodic response of parametrically excited systems and separate the stable and unstable solutions. A discrete model of a pair of spur gear is developed and the friction forces are calculated base on instantaneous dynamic force between gear teeth. The dynamic equation of the system is a linear ordinary differential equation with periodic coefficients. Periodic friction torque, as the parametric excitation is represented by Fourier series. The loci of periodic solutions are determined in μ - Γ plane (coefficient of friction-contact ratio) by strained... 

    Modified Coulomb potential of QED in a strong magnetic field

    , Article 25th International Symposium on Lattice Field Theory, LATTICE 2007, 30 July 2007 through 4 August 2007 ; Volume 42 , 2007 ; 18248039 (ISSN) Sadooghi, N ; Sharif University of Technology
    Sissa Medialab Srl  2007
    Abstract
    The static Coulomb potential of Quantum Electrodynamics is calculated in the presence of a strong magnetic field by computing perturbatively the vacuum expectation value of the corresponding Wilson loop in the lowest Landau level (LLL) approximation. In the LLL, two different regimes of dynamical mass, md yn., can be distinguished. These two regimes are |q2 | ≪ m2 d yn. ≪ |eB| and m2 d yn. ≪ |q2 | ≪ |eB|, where q is the longitudinal components of the momentum relative to the external magnetic field B. As it turns out, the potential in the first regime, |q2 | ≪ m2 d yn. ≪ |eB|, has the general form of a modfied Coulomb potential V1(R, θ ) = −α R A1(α, θ ) −γ A2 R (α 2 ,θ ) + γ 2 A3 (α,θ ) ,... 

    Oxidation effects on transport characteristics of nanoscale MOS capacitors with an embedded layer of silicon nanocrystals obtained by low energy ion implantation

    , Article Materials Science and Engineering B: Solid-State Materials for Advanced Technology ; Volume 124-125, Issue SUPPL , 2005 , Pages 494-498 ; 09215107 (ISSN) Grisolia, J ; Shalchian, M ; Benassayag, G ; Coffin, H ; Bonafos, C ; Schamm, S ; Atarodi, S. M ; Claverie, A ; Sharif University of Technology
    2005
    Abstract
    In this paper, we have studied the effect of annealing under slightly oxidizing ambient (N2 + O2) on the structural and electrical characteristics of a limited number of silicon nanoparticles embedded in an ultra-thin SiO2 layer. These nanoparticles were synthesized by ultra-low energy (1 keV) ion implantation and annealing. Material characterization techniques including transmission electron microscopy (TEM), Fresnel imaging and spatially resolved electron energy loss spectroscopy (EELS) have been used to evaluate the effects of oxidation on structural characteristics of nanocrystal layer. Electrical transport characteristics have been measured on less than one hundred nanoparticles by... 

    From continuous to quantized charging response of silicon nanocrystals obtained by ultra-low energy ion implantation

    , Article Solid-State Electronics ; Volume 49, Issue 7 , 2005 , Pages 1198-1205 ; 00381101 (ISSN) Shalchian, M ; Grisolia, J ; Ben Assayag, G ; Coffin, H ; Atarodi, S. M ; Claverie, A ; Sharif University of Technology
    2005
    Abstract
    In this paper, we present a study on the contribution of silicon nanocrystals to the electrical transport characteristics of large (100 μm × 100 μm) and small (100 nm × 100 nm) metal-oxide-semiconductor (MOS) capacitors at room temperature. A layer of silicon nanocrystals is synthesized within the oxide of these capacitors by ultra-low energy ion implantation and annealing. Several features including negative differential resistance (NDR), sharp current peaks and random telegraph signal (RTS) are demonstrated in the current-voltage and current-time characteristics of these capacitors. These features have been associated to charge storage in silicon nanocrystals and to the resulting Coulomb... 

    Room-temperature quantum effect in silicon nanoparticles obtained by low-energy ion implantation and embedded in a nanometer scale capacitor

    , Article Applied Physics Letters ; Volume 86, Issue 16 , 2005 , Pages 1-3 ; 00036951 (ISSN) Shalchian, M ; Grisolia, J ; Assayag, G. B ; Coffin, H ; Atarodi, S. M ; Claverie, A ; Sharif University of Technology
    2005
    Abstract
    In this article, we present the room-temperature current-voltage characteristics of a nanometer scale (100×100 nm2) metal-oxide-semiconductor capacitor containing few (less than 100) silicon nanoparticles. The layer of silicon nanoparticles is synthesized within the oxide of this capacitor by ultra low-energy ion implantation and annealing. Current fluctuations in the form of discrete current steps and sharp peaks appeared in the static and dynamic I (V) characteristics of the capacitor. These features have been associated to quantized charging and discharging of the nanoparticles and the resulting Coulomb interaction to the tunneling current. © 2005 American Institute of Physics  

    From continuous to quantized charging phenomena in few nanocrystals MOS structures

    , Article 11th International Autumn Meeting on Gettering and Defect Engineering in Semiconductor Technology, GADEST 2005, 25 September 2005 through 30 September 2005 ; Volume 108-109 , 2005 , Pages 25-32 ; 10120394 (ISSN); 9783908451136 (ISBN) Benassayag, G ; Shalchian, M ; Grisolia, J ; Bonafos, C ; Atarodi, S. M ; Claverie, A ; Pichaud B ; Claverie A ; Alquier D ; Richter H ; Kittler M ; Richter H ; Kittler M ; Sharif University of Technology
    Trans Tech Publications Ltd  2005
    Abstract
    In this paper, we present a study on the contribution of silicon nanocrystals to the electrical transport characteristics of large (100 µ x 100 µm) and small (100 nm x 100 nm) metaloxide- semiconductor (MOS) capacitors at room temperature. A layer of silicon nanocrystals is synthesized within the oxide of these capacitors by ultra-low energy ion implantation and annealing. Several features including negative differential resistance (NDR), sharp current peaks and random telegraph signal (RTS) are demonstrated in the current-voltage and current-time characteristics of these capacitors. These features have been associated to charge storage in silicon nanocrystals and to the resulting Coulomb...