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Leak-Gauge: A late-mode variability-aware leakage power estimation framework
, Article Microprocessors and Microsystems ; Volume 37, Issue 8 PARTA , 2013 , Pages 801-810 ; 01419331 (ISSN) ; Momtazpour, M ; Goudarzi, M ; Sharif University of Technology
2013
Abstract
Leakage power has already become the major contributor to the total on-chip power consumption, rendering its estimation a necessary step in the IC design flow. The problem is further exacerbated with the increasing uncertainty in the manufacturing process known as process variability. We develop a method to estimate the variation of leakage power in the presence of both intra-die and inter-die process variability. Various complicating issues of leakage prediction such as spatial correlation of process parameters, the effect of different input states of gates on the leakage, and DIBL and stack effects are taken into account while we model the simultaneous variability of the two most critical...
Accurate estimation of leakage power variability in sub-micrometer CMOS circuits
, Article Proceedings - 15th Euromicro Conference on Digital System Design, DSD 2012 ; 2012 , Pages 18-25 ; 9780769547985 (ISBN) ; Momtazpour, M ; Goudarzi, M ; Sharif University of Technology
2012
Abstract
Leakage power has already become the major contributor to the total on-chip power consumption, rendering its estimation a necessary step in the IC design flow. The problem is further exacerbated with the increasing uncertainty in the manufacturing process known as process variability. We develop a method to estimate the variation of leakage power in the presence of both intra-die and inter-die process variability. Various complicating issues of leakage prediction such as spatial correlation of process parameters, the effect of different input states of gates on the leakage, and DIBL and stack effects are taken into account while we model the simultaneous variability of the two most critical...