Loading...
Search for: cubic-spinel-structure
0.008 seconds

    Structural, spectral, dielectric, and magnetic properties of indium substituted Cu0.5Zn0.5Fe2−xO4 magnetic oxides

    , Article Journal of Materials Science: Materials in Electronics ; 2021 ; 09574522 (ISSN) Junaid, M ; Khan, M. A ; Al Muhimeed, T. I ; AlObaid, A. A ; Nazir, G ; Alshahrani, T ; Mahmood, Q ; Akhtar, M. N ; Sharif University of Technology
    Springer  2021
    Abstract
    The influence of indium on the properties of Cu0.5Zn0.5Fe2O4 nano ferrites synthesized by sol–gel auto-combustion technique was studied. X-ray diffraction (XRD) analysis demonstrated that pure and substituted ferrites possessed cubic spinel structure. The lattice parameter increases with the inclusion of In3+ for x ≤ 0.16 and decreases subsequently. A linear decrease in crystallite size was found as concentration of indium increased. X-ray density, strain, and dislocation density were increased as indium content increases. Hopping lengths as well as radii of A and B sites revealed increasing behavior up to x = 0.16 and decreased thereafter. The spectral bands indicated the formation of... 

    Statistical, morphological, and corrosion behavior of PECVD derived cobalt oxide thin films

    , Article Journal of Materials Science: Materials in Electronics ; Volume 30, Issue 24 , 2019 , Pages 21185-21198 ; 09574522 (ISSN) Jafari, A ; Alam, M. H ; Dastan, D ; Ziakhodadadian, S ; Shi, Z ; Garmestani, H ; Weidenbach, A. S ; Ţălu, Ş ; Sharif University of Technology
    Springer  2019
    Abstract
    Experimental parameters have direct influences on materials properties and therefore their applications. The effect of plasma power on the properties of cobalt oxide thin films, prepared using plasma-enhanced chemical vapor deposition technique, on stainless steel substrates have been addressed in this paper. The structural, morphological, and compositional properties of these films were investigated by means of X-ray diffraction (XRD), atomic force microscopy (AFM), and X-ray photoelectron spectroscopy (XPS) technique. The XRD patterns demonstrated the growth of polycrystalline Co3O4 thin film with a cubic spinel structure such that the intensity of (511) and (311) peaks increase as the...