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    Synchronizability of dynamical scale-free networks subject to random errors

    , Article Physica A: Statistical Mechanics and its Applications ; Volume 390, Issue 23-24 , 2011 , Pages 4588-4595 ; 03784371 (ISSN) Jalili, M ; Sharif University of Technology
    Abstract
    In this paper the robustness of network synchronizability against random deletion of nodes, i.e. errors, in dynamical scale-free networks was studied. To this end, two measures of network synchronizability, namely, the eigenratio of the Laplacian and the order parameter quantifying the degree of phase synchrony were adopted, and the synchronizability robustness on preferential attachment scale-free graphs was investigated. The findings revealed that as the network size decreases, the robustness of its synchronizability against random removal of nodes declines, i.e. the more the number of randomly removed nodes from the network, the worse its synchronizability. We also showed that this... 

    Motion blur identification in noisy images using mathematical models and statistical measures

    , Article Pattern Recognition ; Volume 40, Issue 7 , 2007 , Pages 1946-1957 ; 00313203 (ISSN) Ebrahimi Moghaddam, M ; Jamzad, M ; Sharif University of Technology
    2007
    Abstract
    Motion blur is one of the most common blurs that degrades images. Restoration of such images is highly dependent on estimation of motion blur parameters. Since 1976, many researchers have developed algorithms to estimate linear motion blur parameters. These algorithms are different in their performance, time complexity, precision and robustness in noisy environments. In this paper, we have presented a novel algorithm to estimate linear motion blur parameters such as direction and length. We used Radon transform to find direction and bispectrum modeling to find the length of motion. Our algorithm is based on the combination of spatial and frequency domain analysis. The great benefit of our... 

    Using genetic algorithm to identify soft-error derating blocks of an application program

    , Article Proceedings - 15th Euromicro Conference on Digital System Design, DSD 2012, 5 September 2012 through 8 September 2012 ; September , 2012 , Pages 359-367 ; 9780769547985 (ISBN) Arasteh, B ; Rahmani, A. M ; Mansoor, A ; Miremadi, S. G ; Sharif University of Technology
    2012
    Abstract
    Soft-errors are increasingly considered as a major cause for computer system failures. Software techniques are used as cost-effective and flexible techniques to tolerate soft-errors but the introduced overhead is not acceptable in some safety-critical real-time systems. The identification of the program blocks and protecting only vulnerable blocks against soft-errors reduces the performance overhead. In this paper, we present a genetic algorithm to identify the vulnerable program blocks as well as the derating program blocks against soft-errors. Then, only vulnerable blocks are protected by some software-based soft-error tolerance techniques to achieve a lower performance and space overhead.... 

    Topological code autotune

    , Article Physical Review X ; Volume 2, Issue 4 , October , 2012 ; 21603308 (ISSN) Fowler, A. G ; Whiteside, A. C ; McInnes, A. L ; Rabbani, A ; Sharif University of Technology
    2012
    Abstract
    Many quantum systems are being investigated in the hope of building a large-scale quantum computer. All of these systems suffer from decoherence, resulting in errors during the execution of quantum gates. Quantum error correction enables reliable quantum computation given unreliable hardware. Unoptimized topological quantum error correction (TQEC), while still effective, performs very suboptimally, especially at low error rates. Hand optimizing the classical processing associated with a TQEC scheme for a specific system to achieve better error tolerance can be extremely laborious. We describe a tool, AUTOTUNE, capable of performing this optimization automatically, and give two highly... 

    Single Event Multiple Upset (SEMU) tolerant latch designs in presence of process and temperature variations

    , Article Journal of Circuits, Systems and Computers ; Volume 24, Issue 1 , January , 2015 ; 02181266 (ISSN) Rajaei, R ; Tabandeh, M ; Fazeli, M ; Sharif University of Technology
    World Scientific Publishing Co. Pte Ltd  2015
    Abstract
    In this paper, we propose two novel soft error tolerant latch circuits namely HRPU and HRUT. The proposed latches are both capable of fully tolerating single event upsets (SEUs). Also, they have the ability of enduring single event multiple upsets (SEMUs). Our simulation results show that, both of our HRPU and HRUT latches have higher robustness against SEMUs as compared with other recently proposed radiation hardened latches. We have also explored the effects of process and temperature variations on different design parameters such as delay and power consumption of our proposed latches and other leading SEU tolerant latches. Our simulation results also show that, compared with the reference...