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In this paper, we study the problem of causal features detection in a linear model. In a mathematical model, we consider a dataset of N samples, each represented by a sequence of G binary features. Associated to each sample, there is a binary label. It is assumed that the labels are related to a latent subset of the features, called causal features, via a linear function. More precisely, in our model, each label is the result of a noisy observation of a linear function of the causal features. We assume that the number of the causal features is bounded by L, where L is a given positive integer. In this paper, our objective is to detect the set of the causal features. In this way, at the... 

Atomic force microscopes (AFM) are widely used for feature detection and scanning surface topography of different materials. Contrast of topography images is significantly influenced by the sensitivity of AFM micro cantilever which means enhancement of sensitivity leads to increase of topography images resolution So, in the last years numerous scientists interested in studying the effects of different parameters such as geometric one on the sensitivity of AFM micro cantilevers. V-shape micro cantilever types of AFMs probe are widely used to scan various types of surfaces. In V-shape micro cantilevers, there are many geometric and design parameters which influence the flexural sensitivity of...