Sharif Digital Repository

Statistical behavior and scaling properties of isoheight lines in three different saturated two-dimensional grown surfaces with controversial universality classes are investigated using ideas from Schramm-Loewner evolution (SLEκ). We present some evidence that the isoheight lines in the ballistic deposition (BD), Eden and restricted solid-on-solid (RSOS) models have conformally invariant properties all in the same universality class as the self-avoiding random walk (SAW), equivalently SLE8/3. This leads to the conclusion that all these discrete growth models fall into the same universality class as the Kardar-Parisi-Zhang (KPZ) equation in two dimensions  

This work studies the electrochemical growth behavior of cobalt nanowires in highly ordered aluminum oxide membrane. Considering the electrodeposition of metallic nanowires, cation concentration profile in each nano pore was calculated. With assumption of linear diffusion zone on the growing surface of nanowires, a modified Cottrell equation was evaluated. To confirm the model, the Co nanowires were electrodeposited into porous anodic aluminum oxide (AAO) templates and the mechanism of deposition was studied. Comparing the results of model and the experiments has proved the accuracy of the model. Also, it was observed that the growth of the Co nanowires was controlled mainly by diffusion...