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    Reliability Improvement in Aging-sensitive Units of a Processor

    , Ph.D. Dissertation Sharif University of Technology Rohbani, Nezam (Author) ; Miremadi, Ghasem (Supervisor) ; Ejlali, Alireza (Supervisor)
    Abstract
    Despite the advantages of shrinking transistors’ dimensions, e.g. decrease in power consumption and fabrication cost and increase in their switching speed, it has an adverse impact on some characteristics of nano-scale (less than 130nm) transistors that can reduce the system lifetime. Bias Temperature Instability (BTI) and Hot Carrier Injection (HCI) are amongst the most important adverse effects of transistor shrinkage. These two effects, are known as transistor aging, decrease the switching speed of the transistors by increasing the threshold voltage and decreasing the charge carriers’ mobility in the channel of transistors. Temperature, operating voltage, and the size of transistors have... 

    LAXY: a location-based aging-resilient Xy-Yx routing algorithm for network on chip

    , Article IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ; Volume 36, Issue 10 , 2017 , Pages 1725-1738 ; 02780070 (ISSN) Rohbani, N ; Shirmohammadi, Z ; Zare, M ; Miremadi, S. G ; Sharif University of Technology
    Abstract
    Network on chip (NoC) is a scalable interconnection architecture for ever increasing communication demand between processing cores. However, in nanoscale technology size, NoC lifetime is limited due to aging processes of negative bias temperature instability, hot carrier injection, and electromigration. Usually, because of unbalanced utilization of NoC resources, some parts of the network experience more thermal stress and duty cycle in comparison with other parts, which may accelerate chip failure. To slow down the aging rate of NoC, this paper proposes an oblivious routing algorithm called location-based aging-resilient Xy-Yx (LAXY) to distribute packet flow over entire network. LAXY is...