Sharif Digital Repository

By advances in technology, integrated circuits have come to include more functionality and more complexity in a single chip. Although methods of testing have improved, but the increase in complexity of circuits, keeps testing a challenging problem. Two important challenges in testing of digital circuits are test time and accessing the circuit under test (CUT) for testing. These challenges become even more important in complex system on chip (SoC) zone. This paper presents an improved scheme for generating pre-computed test patterns in core-based systems on chip. This approach reduces the number of pre-computed test patterns and as the result, test application time (TAT) will be decreased.... 

Many smart-card-based remote authentication schemes have been proposed recently. In 2004, Yoon et al. presented an improved scheme which is the leading of a research track started from Sun, 2000. In this paper, we illustrate that Yoon et al.'s scheme is vulnerable to the parallel session attack and propose an enhancement of the scheme to resist that attack. In our scheme the parties further establish a forward-secure session key by employing only hash functions to protect the subsequent communications. We also demonstrate that our scheme has better security in comparison to other related works, while it does not incur much computational cost © 2007 Springer  

In a (t, n) threshold proxy signature scheme, the original signer can delegate the signing power to n proxy signers such that any t or more out of n proxy signers can sign messages on behalf of the original signer, but t -1 or less of the proxy signers cannot generate a proxy signature. In this paper, we will improve the security of Xie's threshold proxy signature scheme against the new types of collusion attack was presented by Liu and Tan in 2007 We also present that our improved scheme is more efficient than Xie's scheme in terms of computational complexities