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    A 1.5V 8-bit low-power self-calibrating high-speed folding ADC

    , Article 2005 PhD Research in Microelectronics and Electronics Conference, Lausanne, 25 July 2005 through 28 July 2005 ; Volume I , 2005 , Pages 33-36 ; 0780393457 (ISBN); 9780780393455 (ISBN) Movahedian, H ; Bakhtiar, M. S ; Sharif University of Technology
    2005
    Abstract
    An 8-bit High-speed folding/interpolating ADC is presented. Designed in 0.18μm CMOS technology, the ADC dissipates only 50mW from a single 1.5V supply. A novel technique based on using both N and P folding cells is used to widen the input range and a self-calibration technique based on using Trimmable MOSFETs is employed to improve the static and dynamic performance  

    On the optimum design of Gain-Boosting Amplifier for high-speed and low-voltage applications

    , Article The 2004 47th Midwest Symposium on Circuits and Systems - Conference Proceedings, Hiroshima, 25 July 2004 through 28 July 2004 ; Volume 1 , 2004 , Pages I1-I4 ; 15483746 (ISSN) Ahmadi, M. M ; Sharif Bakhtiar, M ; Sharif University of Technology
    2004
    Abstract
    Currently, there are no studies investigating the issue of speed optimization of Gain-Boosted Cascode Amplifier in low voltage applications. This is mainly because of the complicated transfer function of high-swing Gain-Boosted Cascode Amplifier structures. This paper proposes a novel and generic model for this amplifier and presents a thorough analysis of its behavior. The aim of this optimization is to eliminate the well-known slow timing component in the step response and obtain the minimum achievable settling time. An ultra high-speed amplifier is presented finally  

    A new low voltage precision CMOS current reference with no external components

    , Article IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing ; Volume 50, Issue 12 , 2003 , Pages 928-932 ; 10577130 (ISSN) Dehghani, R ; Atarodi, S. M ; Sharif University of Technology
    2003
    Abstract
    A novel current reference with low temperature and supply sensitivity and without any external component has been developed in a 0.25 μm mixed-mode process. The circuit is based on a bandgap reference (BGR) voltage and a CMOS circuit similar to a beta multiplier. An NMOS transistor in triode region has been used in place of a resistor in conventional beta multiplier to achieve a current which has a negative temperature coefficient and only oxide thickness dependent. The BGR voltage has a positive temperature coefficient to cancel the negative temperature coefficient of the beta multiplier. The simulation results using Bsim3v3 model show max-to-min fluctuation of less than 1 % over a... 

    Design considerations for A 1.5-V, 10.7-MHz bandpass GM-C filter in A 0.6-UM standard CMOS techology

    , Article Proceedings of the 2003 IEEE International Symposium on Circuits and Systems, Bangkok, 25 May 2003 through 28 May 2003 ; Volume 1 , 2003 , Pages I521-I524 ; 02714310 (ISSN) Tajalli, A ; Atarodi, S. M ; Sharif University of Technology
    2003
    Abstract
    A single 1.5 V supply, second order band-pass gm-C filter based on a low-voltage transconductor architecture in standard 0.6 um CMOS process is presented. A dc level shifter circuit (DCLS) is utilized at the input of the proposed transconductor to increase the dc level of the input signal. This makes the input transistors operate in the desired region and hence input voltage swing enhances. DCLS uses a simple voltage doubler as its supply while other parts of the circuit use the main 1.5 V supply. Proposed transconductor shows a THD of -60 dB for 1.4 Vpp,diff input signal with 1 MHz frequency. Also a proper common-mode detector circuit is developed for this low-voltage application. The... 

    A nonlinear feed-forward memory-less model to fast prediction of threshold voltage in junction-less double-gate MOSFETs

    , Article International Journal of Numerical Modelling: Electronic Networks, Devices and Fields ; Volume 34, Issue 1 , 2021 ; 08943370 (ISSN) Annabestani, M ; Nasserian, M ; Hasanzadeh, F ; Taherzadeh Sani, M ; Hassanzadeh, A. R ; Sharif University of Technology
    John Wiley and Sons Ltd  2021
    Abstract
    Decreasing Drain-Induced-Barrier-Lowering (DIBL) is one of the nondesirable short-channel effects, causes the threshold voltage of the transistor to be reduced by increasing the drain voltage. DIBL makes it impossible for engineers to consider VT as a constant, and it is necessary to calculate VT as a function of the drain voltage. Therefore, to consider the DIBL effect in the design of ICs, a large computational burden is imposed on the system, which slows down the simulation process in circuit-level simulators. Accordingly, a Nonlinear Feed-Forward Memory-Less (NFFML) model using the Gram-Schmidt orthogonalization approach is proposed, which calculates the VT of the new generation of... 

    High temperature superconductors as a two-dimensional electron gas

    , Article Physica Status Solidi C: Conferences ; Volume 1, Issue 7 , 2004 , Pages 1828-1831 ; 16101634 (ISSN) Mohammadizadeh, M. R ; Akhavan, M ; Sharif University of Technology
    2004
    Abstract
    Based on transport and magnetic measurements on Gd(Ba2-xPr x)Cu3O7+δ, and some other properties of high temperature superconductors (HTSC), we have extracted similarities between superconductors, two-dimensional electron gas (2D-EG) i.e., MOSFETs. These are based on properties such as superconductor-insulator transition in superconductors and metal-insulator transition (MIT) in 2D-EG with doping and magnetic field, localization in transport conduction, quantum unit of resistance at MIT, larger change in resistivity from critical doping to the insulating side in comparison with change from critical doping to the metallic side, and strongly electron-electron coupling. These similarities could... 

    Reliability assessment of some high side MOSFET drivers for buck converter

    , Article 2013 3rd International Conference on Electric Power and Energy Conversion Systems, EPECS 2013, Istanbul ; 2013 ; 9781479906888 (ISBN) Javadian, V ; Kaboli, S ; Sharif University of Technology
    2013
    Abstract
    Nowadays power electronic devices have a wide usage in the industries and different electrical equipment for power conditioning. As a point of view, reliability is one of important figure of merits that should be considered to have long life time and also have more probability to do exactly the proposed mission. In this paper some methods are presented to improve the reliability of power electronic components. Also some methods of system reliability improvement are reviewed. One group of converters is DC-DC step down converter which is used in different applications such as battery charger and voltage regulator. In this paper as an example, reliability of a DC-DC step down converter with... 

    Design, analysis and implementation of class-E ZCS/ZCDS power amplifier for any duty ratio with nonlinear output parasitic capacitance

    , Article Analog Integrated Circuits and Signal Processing ; Volume 89, Issue 1 , 2016 , Pages 185-195 ; 09251030 (ISSN) Lotfi, A ; Medi, A ; Sharif University of Technology
    Springer New York LLC 
    Abstract
    This paper gives the design and analysis approaches for the class-E power amplifier with a shunt inductor under the nominal conditions, i.e., zero-current switching (ZCS) and zero-current derivative switching (ZCDS), with taking into account the MOSFET nonlinear output parasitic capacitance at any duty ratio. Although, the class-E ZCS/ZCDS conditions obtained high-efficiency, but the switch-current waveform affected by the slope of the voltage across the MOSFET nonlinear drain-to-source parasitic capacitance during the switch-off state, which restricted the operating frequency. On the other hand, the duty ratio is an adjustment parameter to obtain high-frequency operation. Therefore, the... 

    Full quantum mechanical simulation of a novel nanoscale DG-MOSFET: 2D NEGF approach

    , Article IEEE AFRICON 2007, Windhoek, 26 September 2007 through 28 September 2007 ; December , 2007 ; 142440987X (ISBN); 9781424409877 (ISBN) Dehdashti, N ; Orouji, A. A ; Faez, R ; Sharif University of Technology
    2007
    Abstract
    In this paper the electrical characteristics of a novel nanoscale double-gate MOSFET (DG-MOSFET) have been investigate by a full Quantum Mechanical simulation framework. This framework consists of Non-Equilibrium Green's Function (NEGF) solved self-consistently with Poisson's Equation. Quantum transport equations are solved in two-dimension (2-D) by recursive NEGF method in active area of the device to obtain the charge density and Poisson's equation is solved in entire domain of simulation to get potential profile. Once self-consistently achieved all parameters of interest (e.g. potential profile, charge density, DIBL, etc) can be measured. In this novel DG-MOSFET structure, a front gate... 

    Two-dimensional quantum simulation of scaling effects in ultrathin body MOSFET structure: NEGF approach

    , Article 14th International Workshop on the Physics of Semiconductor Devices, IWPSD, Mumbai, 16 December 2007 through 20 December 2007 ; 2007 , Pages 240-242 ; 9781424417285 (ISBN) Orouji, A.A ; Dehdashti, N ; Faez, R ; Sharif University of Technology
    2007
    Abstract
    For the first time, we present self-consistent solution of ultrathin body device structures to investigate the device parameters variation on the characteristics of nanoscale MOSFET. Our two dimensional (2-D) device simulator Is based on Nonequlibrium Green's Function (NEGF) forma lism. Starting from a basic structure (DG-MOSFET) with a gate length of 10 nm, variation of gate length, channel thickness, gate oxide parameters was carried out in connection with the numerical calculation of device characteristics. In this work Quantum transport equations are solved in 2-D by NEGF method in active area of the device to obtain the charge density and Poisson's equation is solved in entire domain of... 

    Efficiency improvement of a high step up high efficiency converter for photovoltaic applications based on three-state switching cell

    , Article PEDSTC 2013 - 4th Annual International Power Electronics, Drive Systems and Technologies Conference ; 2013 , Pages 454-458 ; 9781467344845 (ISBN) Babaee Zarch, M. J ; Zolghadri, M. R ; Hajimoradi, M. R ; Sharif University of Technology
    2013
    Abstract
    This paper suggests methods for improving efficiency of a high step up high efficiency converter based on three state commutation cells. A loss analysis has been performed to identify the source of power loss. Based on this analysis, methods are presented to reduce losses in the most power dissipating elements. These methods include replacing some power diodes with large conduction losses with MOSFETs having small on-state resistance. Efficiency improvement up to %1.25 percent is verified in simulation and experimental results  

    Modeling of dynamic trap density increase for aging simulation of any MOSFET circuits

    , Article European Solid-State Device Research Conference, 11 September 2017 through 14 September 2017 ; 2017 , Pages 192-195 ; 19308876 (ISSN) ; 9781509059782 (ISBN) Miura Mattausch, M ; Miyamoto, H ; Kikuchihara, H ; Navarro, D ; Maiti, T. K ; Rohbani, N ; Ma, C ; Mattausch, H. J ; Schiffmann, A ; Steinmair, A ; Seebacher, E ; Sharif University of Technology
    Abstract
    A compact aging model for circuit simulation has been developed by considering all possible trapped carriers within MOSFETs. The hot carrier effect and the N(P)BTI effect are modeled by integrating the substrate current as well as the oxide field change due to the trapped carriers. Additionally, the carriers trapped within the highly resistive drift region are included for high-voltage (HV)-MOSFET modeling. The aging model considers the dynamic trap-density increase as a function of circuit-operation time with dynamically varying stress conditions for each individual MOSFET. A self-consistent solution is obtained by iteratively solving the Poisson equation including the trap density. The... 

    Circuit-aging modeling based on dynamic MOSFET degradation and its verification

    , Article International Conference on Simulation of Semiconductor Processes and Devices, SISPAD, 7 September 2017 through 9 September 2017 ; Volume 2017-September , 2017 , Pages 97-100 ; 9784863486102 (ISBN) Rohbani, N ; Miyamoto, H ; Kikuchihara, H ; Navarro, D ; Maiti, T. K ; Ma, C ; Miura Mattausch, M ; Miremadi, S. G ; Mattausch, H. J ; Sharif University of Technology
    Abstract
    The reported investigation aims at developing a compact model for circuit-aging simulation. The model considers dynamic trap-density increase during circuit operation in a consistent way. The model has been applied to an SRAM cell, where it is believed that the NBTI effect dominates. Our simulation verifies that the hot-carrier effect has a compensating influence on the NBTI aging of SRAM cells. © 2017 The Japan Society of Applied Physics  

    Compact modeling of dynamic trap density evolution for predicting circuit-performance aging

    , Article Microelectronics Reliability ; Volume 80 , 2018 , Pages 164-175 ; 00262714 (ISSN) Miura Mattausch, M ; Miyamoto, H ; Kikuchihara, H ; Maiti, T. K ; Rohbani, N ; Navarro, D ; Mattausch, H. J ; Sharif University of Technology
    Abstract
    It is shown that a compact MOSFET-aging model for circuit simulation is possible by considering the dynamic trap-density increase, which is induced during circuit operation. The dynamic trap/detrap phenomenon, which influences the switching performance, is also considered on the basis of well-known previous results. Stress-dependent hot-carrier effect and NBTI effect, origins of the device aging, are modeled during the circuit simulation for each device by integrating the substrate current as well as by determining the oxide-field change due to the trapped carriers over the individual stress-duration periods. A self-consistent solution can be obtained only by iteratively solving the Poisson... 

    Consistent Predictive Simulation of SRAM-Cell Performance Degradation Including Both MOSFET Fabrication Variation and Aging

    , Article 2nd IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2018, 13 March 2018 through 16 March 2018 ; 2018 , Pages 31-33 ; 9781538637111 (ISBN) Gau, H ; Rohbani, N ; Maiti, T. K ; Navarro, D ; Miura-Mattausch, M ; Mattausch, H. J ; Takatsuka, H ; Sharif University of Technology
    Institute of Electrical and Electronics Engineers Inc  2018
    Abstract
    We have developed a methodology to simulate circuit aging including the device fabrication variation with less simulation effort. As an example a 6T SRAM cell has been investigated. It is demonstrated that the variability range of the circuit performance is further enhanced due to the long-term device aging. Among the device parameters, the impurity concentration variation plays a particularly important role for the circuit performance variation. However, most sensitive for the aging degradation is the channel-length variation, because it increases the aging effect drastically. Further, the individual aging of each MOSFET is strongly dependent on the actual stress during circuit operation. ©... 

    A new computational algorithm for contact friction modeling of large plastic deformation in powder compaction processes

    , Article International Journal of Solids and Structures ; Volume 46, Issue 2 , 2009 , Pages 287-310 ; 00207683 (ISSN) Khoei, A. R ; Biabanaki, S. O. R ; Vafa, A. R ; Yadegaran, I ; Keshavarz, Sh ; Sharif University of Technology
    2009
    Abstract
    In this paper, the large deformation frictional contact of powder forming process is modeled based on a new computational algorithm by imposing the contact constraints and modifying the contact properties of frictional slip. A simple and efficient numerical algorithm is presented for imposing the contact constraints and frictional contact properties based on the node-to-surface contact technique to simulate the large deformation contact problem in the compaction process of powder. The Coulomb friction law is used to simulate the friction between the rigid punch and the workpiece by the use of penalty approach. A double-surface cap plasticity model is employed together with the nonlinear... 

    A new computational algorithm for 3D contact modeling of large plastic deformation in powder forming processes

    , Article Computational Materials Science ; Volume 46, Issue 1 , 2009 , Pages 203-220 ; 09270256 (ISSN) Khoei, A. R ; Biabanaki, S. O. R ; Vafa, A. R ; Taheri Mousavi, S. M ; Sharif University of Technology
    2009
    Abstract
    In this paper, the three-dimensional large deformation frictional contact of powder forming process is modeled using a simple computational algorithm based on the augmented-Lagrange approach. The technique is applied by imposing the contact constraints and modifying the contact properties of frictional slip through the node-to-surface (NTS) contact algorithm. The Coulomb friction law is employed to simulate the friction between the rigid punch and the work-piece by the use of penalty and augmented-Lagrange approaches. It is shown that the augmented-Lagrange technique significantly improves imposing of the constraints on contact surfaces. The nonlinear contact friction algorithm is employed... 

    A new high step-up interleaved LLC converter

    , Article 12th Power Electronics, Drive Systems, and Technologies Conference, PEDSTC 2021, 2 February 2021 through 4 February 2021 ; 2021 ; 9780738111971 (ISBN) Amani, D ; Beiranvand, R ; Zolghadri, M ; Sharif University of Technology
    Institute of Electrical and Electronics Engineers Inc  2021
    Abstract
    In this study, a new LLC resonant converter for high-voltage high-power applications is introduced. The introduced power converter is a two-phase interleaved full-bridge based that uses a transformer with secondary and tertiary windings to obtain higher output voltage. Zero voltage switching (ZVS) at MOSFETs turn on and zero current switching (ZCS) for all the output diodes at turn off are achieved for a wide range of input voltage (100 V-200 V) and output power (200 W-1500 W) variations. Simulation results show a 95% peak efficiency. © 2021 IEEE  

    Low-voltage CMOS transconductor-C filter design using charge-pump circuit

    , Article Analog Integrated Circuits and Signal Processing ; Volume 44, Issue 3 , 2005 , Pages 219-229 ; 09251030 (ISSN) Tajalli, A ; Atarodi, M ; Sharif University of Technology
    2005
    Abstract
    A very low voltage transconductor for video frequency range applications and compatible with standard CMOS technology is described. In the proposed transconductor, except the DC level shifter circuit (DCLS), the whole transconductor uses the main supply voltage [which can be as low as 1.5 V in a standard 0.6 μm CMOS technology] while the DCLS uses a simple charge-pump circuit as its supply voltage and has a very low current consumption. In addition, proper common-mode sense and charge-pump circuits are developed for this low-voltage application. Meanwhile, some techniques to improve the frequency response, linearity, and noise performance of the proposed transconductor are described. In a... 

    Simultaneous optimization and simulation of a-Si1-xC x layers on n-type silicon solar cells

    , Article Solar Energy Materials and Solar Cells ; Volume 85, Issue 4 , 2005 , Pages 467-476 ; 09270248 (ISSN) Vesaghi, M. A ; Asadi, K ; Sharif University of Technology
    2005
    Abstract
    We have applied Rosenbrock's optimization algorithm to obtain the optimized efficiency of a solar cell and its structural parameters. To obtain these parameters, we have developed a computer program for simultaneous optimization and simulation of the solar cell. We have used experimental data on the electrical and optical properties of a-Si1-xCx layers, put them into the written code and obtained the optimized parameters of this solar cell. The maximum efficiency is 6.32% which is close to one experimental result. © 2004 Elsevier B.V. All rights reserved