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    Process-Variation-Aware Configuration Selection of Configurable MPSOC for Power-Yield Maximization

    , M.Sc. Thesis Sharif University of Technology Izadyar, Hamideh (Author) ; Goudarzi, Maziar (Supervisor)
    Abstract
    Process Variation is seen as statistical variations in leakage current and delay of transistors in nano-scale technologies. The amount of process variations increase as the size of transistors decrease by technology scaling such that those effects can be seen in frequency of MPSoC (Multi-Processor System-on-Chip) cores and their leakage power deviation. These variations cause the tasks duration and power consumption fluctuate in different processors in an MPSoC instance. Consequently, some chip instances of the same MPSoC may consume more time and power than their considered limitations. Hence considering the process variation is necessary and required for MPSoC optimization at different...