Search for: noncontact-atomic-force-microscopy
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    Atomic interactions between metallic tips and surfaces in NC-AFM

    , Article Journal of Physics D: Applied Physics ; Volume 48, Issue 12 , February , 2015 ; 00223727 (ISSN) Pishkenari, H. N ; Sharif University of Technology
    Institute of Physics Publishing  2015
    In this paper, the atomic-scale interactions between metallic tips and samples in noncontact atomic force microscopy (NC-AFM) are studied using molecular dynamics simulations. The effects of the tip and sample materials, the surface plane direction and the lateral position of the tip with respect to the sample, on the interaction force and the dissipated energy, are investigated. The simulations conducted demonstrate that, generally, we can classify the possible outcomes for the dynamics due to the tip-surface interactions into four major categories. The first category includes all cases in which there are no considerable instabilities in tip-surface interactions, leading to negligible... 

    Hybrid finite-element method-molecular dynamics approach for modelling of non-contact atomic force microscopy imaging

    , Article Micro and Nano Letters ; Volume 6, Issue 6 , June , 2011 , Pages 412-416 ; 17500443 (ISSN) Pishkenari, H. N ; Mahboobi, S. H ; Meghdari, A ; Sharif University of Technology
    Models capable of accurate simulation of the microcantilever dynamics coupled with complex tip-sample interactions are essential for interpretation of the imaging results in non-contact atomic force microscopy (AFM). In the present research, a combination of finite element and molecular dynamics methods are used for modelling the AFM system to overcome the drawbacks of conventional approaches that use a lumped system with van der Waals interaction. To illustrate the ability of the proposed scheme in providing images with atomic resolution, some simulations have been performed. In the conducted simulations, a diamond tip is interacting with nickel samples having different surface plane... 

    Layer-by-layer self assembly deposition and characterization of TiO 2 nanoparticles by using a short chain polycation

    , Article EPJ Applied Physics ; Volume 48, Issue 1 , 2009 , Pages 10602p1-10602p7 ; 12860042 (ISSN) Rahman, M ; Taghavinia, N ; Sharif University of Technology
    Using low molecular weight polyethylenimine (PEI), transparent thin films of TiO2 nanoparticles were prepared by layer-by-layer self assembly method. UV-visible spectrophotometry was employed in a quantitative manner to monitor the adsorbed mass of TiO2 and PEI after each dip cycle. The adsorption of both TiO2 and PEI showed a saturation dip time of 10 min. The effect of dip time on the growth mode and surface morphology was investigated by scanning electron microscopy (SEM) and non-contact atomic force microscopy (AFM). It was found that growth proceeds in the form of laterally broad islands in case of short dip times, and taller but laterally smaller islands in case of longer dip times. A...