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With the recent development in Non-Volatile Memory (NVM) technologies, several studies have suggested using them as an alternative to SRAMs in on-chip caches. However, limited endurance of NVMs is a major challenge when employed in the caches. This paper proposes a data manipulation technique, so-called Wearout Informed Pattern Elimination (WIPE), to improve the endurance of NVM-based caches by reducing the activity of frequent data patterns. Simulation results show that WIPE improves the endurance by up to 93% with negligible overheads. © 2017 IEEE  

With the development of Non-Volatile Memory (NVM) technologies in recent years, several studies suggest using them as an alternative for SRAMs in on-chip caches. One of the main challenges in replacing SRAMs with NVMs is limited endurance of NVMs (i.e. the maximum allowed number of write operations in an NVM cell). The endurance of NVM caches is directly affected not only by workload behaviors, but also by process variations (PVs). Several studies characterized the endurance of NVM caches but they do not consider the simultaneous effects of the PVs and the workloads. In this paper, we propose a high-level framework to investigate the endurance of NVM caches affected by the per-cell endurance... 

Nanoelectromechanical (NEM) relays are a promising emerging technology that has gained widespread research attention due to its zero leakage current, sharp ON-OFF transitions, and complementary metal-oxide-semiconductor compatibility. As a result, NEM relays have been significantly investigated as highly energy-efficient design solutions. A major shortcoming of NEMs preventing their widespread use is their limited switching endurance. Hence, in order to utilize the low-power advantages of NEM relays, further device, circuit, and architectural techniques are required. In this paper, we introduce the concept of shadow NEM relays, which is a circuit-level technique to leverage the energy...