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    New SNDR enhancement techniques in pipelined ADC

    , Article 2013 21st Iranian Conference on Electrical Engineering ; May , 2013 , Page(s): 1 - 5 ; 9781467356343 (ISBN) Ghadi, M. H ; Safavi, S. M ; Sharifkhani, M ; Sharif University of Technology
    2013
    Abstract
    Signal to Noise and Distortion Ratio (SNDR) is widely chosen for dynamic characterization of ADC. For pipelined ADC in which the inner circuits' errors accumulate at the output, analysis of the origins of SNDR and its characterization can be very hard. However, due to a relationship between maximum INL of ADC and the distortion in its output codes, SNDR can be derived as a function of maximum INL value and its position in output codes. Utilizing this relationship, this paper develops two methods for SNDR enhancement that do not cost much power. The 50k sampled Monte-Carlo simulation in the behavioral level indicates 75% increase in the possibility of having SNDR > 60db just by utilizing... 

    A low-power 10-Bit 40-MS/s pipeline ADC using extended capacitor sharing

    , Article Proceedings - IEEE International Symposium on Circuits and Systems ; 1- 5 June , 2014 , pp. 1147-1150 ; ISSN: 02714310 Esmaeelzadeh, H ; Sharifkhani, M ; Shabany, M ; Sharif University of Technology
    Abstract
    This paper describes a new capacitor sharing technique for pipeline ADCs. It enables power reduction of the first and second MDACs simultaneously. The presented noise and power analysis shows that the proposed method is about 30% more efficient than the conventional one in terms of the first and second MDACs power dissipation. A 10-bit 40MS/s pipeline ADC employing the proposed technique was designed in 90-nm CMOS technology achieving a power consumption of 4.2 mW  

    Fast static characterization of residual-based ADCs

    , Article IEEE Transactions on Circuits and Systems II: Express Briefs ; Volume 60, Issue 11 , 2013 , Pages 746-750 ; 15497747 (ISSN) Hassanpourghadi, M ; Sharifkhani, M ; Sharif University of Technology
    2013
    Abstract
    Computationally exhaustive time-domain Monte Carlo (MC) simulations are commonly conducted to obtain the static characteristics of a residual analog-to-digital converter (ADC) (e.g., pipelined ADC) for the calculation of the integral nonlinearity (INL) and differential nonlinearity (DNL). In this brief, a new ultrahigh-speed, yet precise, behavioral-level dc characterization algorithm for residual-based ADC is introduced. The algorithm derives the transition points of a given stage of the ADC based on the random parameters of that stage. Then, it merges the dc characteristics of all stages together to extract detailed dc input-output characteristics for the entire ADC. Then, the exact amount... 

    Performance comparison of switched-capacitor and switched-current pipeline ADCs

    , Article 2007 IEEE International Symposium on Circuits and Systems, ISCAS 2007, New Orleans, LA, 27 May 2007 through 30 May 2007 ; 2007 , Pages 2252-2255 ; 02714310 (ISSN) Nikandish, G ; Sedighi, B ; Sharif Bakhtiar, M ; Sharif University of Technology
    Institute of Electrical and Electronics Engineers Inc  2007
    Abstract
    In this paper a theoretical comparison between the performance of switched-capacitor (SC) and switched-current (SI) pipeline analog-to-digital converters (ADCs) is presented. Power dissipation and die area of SC and SI implementations are compared based on linearity and noise constraints. It is shown that if nonlinearity errors of the class AB SI ADCs are removed by calibration, their performance prevails that of the SC ADCs. Also it is shown that class AB SI ADCs occupy less die area than SC ADCs for a given resolution. © 2007 IEEE  

    INL prediction method in pipeline ADCs

    , Article APCCAS 2006 - 2006 IEEE Asia Pacific Conference on Circuits and Systems, 4 December 2006 through 6 December 2006 ; 2006 , Pages 13-16 ; 1424403871 (ISBN); 9781424403875 (ISBN) Nikandish, G ; Sedighi, B ; Bakhtiar, M. S ; Sharif University of Technology
    2006
    Abstract
    In this paper a general method for system level prediction of INL in pipeline analog to digital converters is presented. For each stage of the ADC, a new error model consisting of an input referred gain error and a nonlinear term is introduced. An analytic method to calculate INL from all error sources is presented. INL model for a switched-capacitor implementation is also presented. ©2006 IEEE  

    A low power 1-V 10-bit 40-MS/s pipeline ADC

    , Article 2011 18th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2011, 11 December 2011 through 14 December 2011 ; December , 2011 , Pages 212-215 ; 9781457718458 (ISBN) Hashemi, M ; Sharifkhani, M ; Gholami, M ; Sharif University of Technology
    2011
    Abstract
    A low power 10 bit, 40 MS/s pipeline analog to digital converter is presented. A number of low-power techniques are proposed in various levels of abstraction. In circuit level, a low power class A/AB opamp with direct common-mode-feedback circuit (CMFB) is proposed which significantly reduces power in the opamps. In backend design, optimal series capacitors are layed out to break the deadlock between the mismatch and loading effect of the first stage capacitors. A customized software tool is developed based on the proposed opamp and architecture which provides optimum stage scaling factors, tail current and opamp transistor sizes. Simulations in 0.13um CMOS technology show that the ADC... 

    Yield constrained automated design algorithm for power optimized pipeline ADC

    , Article Integration ; Volume 74 , 2020 , Pages 55-62 Sadrafshari, V ; Sadrafshari, S ; Sharifkhani, M ; Sharif University of Technology
    Elsevier B.V  2020
    Abstract
    Pipeline Analog to Digital Converter (ADC) design processes include several redesign steps to achieve the optimum solution. Hence, designers prefer to use automated algorithms for this purpose. In this paper, an automated algorithm for CAD tool is presented considering the trade-off between yield and power consumption for pipeline ADCs. This automated algorithm benefits from multiple degrees of freedom including the system level down to transistor level parameters, which helps CAD tools to find the optimized solution. It allows designers to choose an optimum scenario considering the trade-off between yield and power consumption. To evaluate the capabilities of this algorithm, a 10-bit...