Sharif Digital Repository

To monitor the quality of a multi-attribute process, some issues arise. One of them being the occurrence of a high number of false alarms (type I error) and the other an increase in the probability of not detecting defects when the process is monitored by a set of independent uni-attribute control charts. In this paper, based upon the artificial neural network capabilities we develop a new methodology to overcome this problem. We design a perceptron neural network to monitor either the proportions of several types of product nonconformities (instead of using several np charts) or the number of different types of defects (instead of using several c charts) in a product. Moreover, while the...