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    A Scan Chain-Based Aging Monitoring Scheme for Detection of Recycled Chips

    , M.Sc. Thesis Sharif University of Technology Ostovar, Atanaz (Author) ; Hesabi, Shahin (Supervisor)
    Abstract
    Today's latest technology integrated circuits are manufactured for a wide range of applications. With the constant increase in the usage rate of integrated circuits, designing a high reliable system is of utmost importance. The avoidance of counterfeit components is a major challenge of hardware security and trust. Counterfeit components cause lower performance and reduced life span. They are of great concern to the manufacturers and consumers of electronic systems, impacting the security and reliability of these systems. If these parts end up in critical applications like medical systems, satellites, aerospace, or power plants, the results could be catastrophic. So far, there are different...