Sharif Digital Repository

In this paper, we present a scan-chain-based multiple error recovery technique for triple modular redundancy (TMR) systems (SMERTMR). The proposed technique reuses scan-chain flip-flops fabricated for testability purposes to detect and correct faulty modules in the presence of single or multiple transient faults. In the proposed technique, the manifested errors are detected at the modules' outputs, while the latent faults are detected by comparing the internal states of the TMR modules. Upon detection of any mismatch, the faulty modules are located and the state of a fault-free module is copied into the faulty modules. In case of detecting a permanent fault, the system is degraded to a... 

We propose a roll-forward error recovery technique based on multiple scan chains for TMR systems, called Scan chained TMR (ScTMR). ScTMR reuses the scan chain flip-flops employed for testability purposes to restore the correct state of a TMR system in the presence of transient or permanent errors. In the proposed ScTMR technique, we present a voter circuitry to locate the faulty module and a controller circuitry to restore the system to the fault-free state. As a case study, we have implemented the proposed ScTMR technique on an embedded processor, suited for safety-critical applications. Exhaustive fault injection experiments reveal that the proposed architecture has the error detection and...