Sharif Digital Repository

This thesis is aimed at the modeling and control of atomic force microscope (AFM) in order to improve the scanning speed and achieving video-rate imaging to realize the real-time observation of dynamic phenomena at the nanoscale. The lumped parameter model of the AFM in the non-contact operation mode is studied in this project. The tip-sample interaction is the Van der Waals force, which makes the model nonlinear. Two mathematical models of the AFM cantilever are derived and investigated in order to gain detailed insights into the system dynamics. These models are tip excited and base excited cantilever. The former is solved by the method of multiple scales and the latter is analyzed by the...