Sharif Digital Repository

Atomic force microscopes (AFM) can image and manipulate sample properties at the atomic scale. The non-contact mode of AFM offers unique advantages over other contemporary scanning probe techniques, especially when utilized for reliable measurements of soft samples (e.g., biological species). The distance between cantilever tip and sample surface is a time varying parameter even for a fixed sample height, and hence, difficult to identify. A remedy to this problem is to directly identify the sample height in order to generate high precision, atomic-resolution images. For this, the microcantilever is modeled by a single mode approximation and the interaction between the sample and cantilever...