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    The effect of Si addition and Ta diffusion barrier on growth and thermal stability of NiSi nanolayer

    , Article Microelectronic Engineering ; Volume 85, Issue 3 , 2008 , Pages 548-552 ; 01679317 (ISSN) Kargarian, M ; Akhavan, O ; Moshfegh, A. Z ; Sharif University of Technology
    2008
    Abstract
    Formation and thermal stability of nanothickness NiSi layer in Ni(Pt 4 at.%)/Si(1 0 0) and Ni0.6Si0.4(Pt 4 at.%)/Si(1 0 0) structures have been investigated using magnetron co-sputtering deposition method. Moreover, to study the effect of Si substrate in formation of NiSi and its thermal stability, we have used Ta diffusion barrier between the Ni0.6Si0.4 layer and the Si substrate. Post annealing treatment of the samples was performed in an N2 environment in a temperature range from 200 to 900 °C for 2 min. The samples were analyzed by four point probe sheet resistance (Rs) measurement, X-ray diffraction (XRD) and atomic force microscopy (AFM) techniques. It was found that the annealing... 

    Synthesis of graphene from natural and industrial carbonaceous wastes

    , Article RSC Advances ; Vol. 4, issue. 39 , 2014 , p. 20441-20448 Akhavan, O ; Bijanzad, K ; Mirsepah, A ; Sharif University of Technology
    Abstract
    Graphene oxide (GO) and reduced graphene oxide (rGO) sheets have usually been synthesized through Hummers' method by using highly pure graphite (HPG) as the main starting material. However, HPG can be relatively expensive for mass production of high-quality graphene. In this work, a general method for synthesis of high-quality GO and rGO sheets from various natural and industrial carbonaceous wastes such as vegetation wastes (wood, leaf, bagasse, and fruit wastes), animal wastes (bone and cow dung), a semi-industrial waste (newspaper), and an industrial waste (soot powders produced in exhaust of diesel vehicles) was developed. Based on atomic force microscopy, Raman spectroscopy, X-ray... 

    Optimization of sputtering parameters for the deposition of low resistivity indium tin oxide thin films

    , Article Acta Metallurgica Sinica (English Letters) ; Vol. 27, issue. 2 , Apr , 2014 , p. 324-330 Yasrebi, N ; Bagheri, B ; Yazdanfar, P ; Rashidian, B ; Sasanpour, P ; Sharif University of Technology
    Abstract
    Indium tin oxide (ITO) thin films have been deposited using RF sputtering technique at different pressures, RF powers, and substrate temperatures. Variations in surface morphology, optical properties, and film resistances were measured and analyzed. It is shown that a very low value of sheet resistance (1.96 ω/sq.) can be achieved with suitable arrangement of the deposition experiments. First, at constant RF power, deposition at different pressure values is done, and the condition for achieving minimum sheet resistance (26.43 ω/sq.) is found. In the next step, different values of RF powers are tried, while keeping the pressure fixed on the previously found minimum point (1-2 Pa). Finally,... 

    Hydrogen-rich water for green reduction of graphene oxide suspensions

    , Article International Journal of Hydrogen Energy ; Volume 40, Issue 16 , 2015 , Pages 5553-5560 ; 03603199 (ISSN) Akhavan, O ; Azimirad, R ; Gholizadeh, H. T ; Ghorbani, F ; Sharif University of Technology
    Elsevier Ltd  2015
    Abstract
    Abstract H2-rich water as a green antioxidant was applied for deoxygenation of graphene oxide (GO) suspensions. The ability of H2-rich water for deoxygenation of GO sheets was found comparable to the ability of hydrazine (as a standard and powerful reductant), using X-ray photoelectron spectroscopy. In fact, the O/C ratio of GO sheets could be reduced from 0.51 to 0.21 and 0.16 by H2-rich water and hydrazine, respectively. More importantly, while C-N bond formation is one of the side effects of GO reduction by hydrazine, no chemical C-N bond was found on the H2-water-reduced GO (rGO) sheets. This also resulted in a better restoration of the graphitic structure of the H2-water-rGO, as... 

    Rolled graphene oxide foams as three-dimensional scaffolds for growth of neural fibers using electrical stimulation of stem cells

    , Article Carbon ; Volume 97 , 2016 , Pages 71-77 ; 00086223 (ISSN) Akhavan, O ; Ghaderi, E ; Shirazian, S. A ; Rahighi, R ; Sharif University of Technology
    Elsevier Ltd 
    Abstract
    Graphene oxide foam (GOF) layers with thicknesses of ∼15-50 μm and density of ∼10 graphene oxide (GO) sheets/μm were fabricated by precipitation of chemically exfoliated GO sheets in an aqueous suspension at ∼80 °C under UV irradiation. Then, rolled GOFs with desirable scales were developed as electrically conductive 3D-scaffolds and applied in directional growth of neural fibers, through differentiation of human neural stem cells (hNSCs) into neurons under an electrical stimulation. X-ray photoelectron spectroscopy indicated that the UV irradiation resulted in partial deoxygenation of the layers. Scanning electron microscopy and Raman spectroscopy confirmed the presence of multilayer GO... 

    Improving the multi-step fabrication approach of copper nanofiber networks based transparent electrode for achieving superb conductivity and transparency

    , Article Materials Research Express ; Volume 6, Issue 9 , 2019 ; 20531591 (ISSN) Mohamadbeigi, N ; Angizi, S ; Sadrnezhaad, S. K ; Nikzad, M. J ; Sharif University of Technology
    Institute of Physics Publishing  2019
    Abstract
    Transparent Conductive Electrode (TCE), as an essential part of the optoelectronic devices, has become popular owing to its unique properties such as high optical transmittance and conductivity. Among utilized materials for fabrication of TCE, copper nanofibers (NFs)-network have been attracting much attention due to its extraordinary properties such as low sheet resistance, the scalable manufacturing and low-cost fabrication method. However, many challenges exist in the way of multi-step fabrication of network to increase the NFs continuity and consequently, improvement of their electrical conductivity as TCE. Herein, we report a deep investigation of the effective parameters on diameter... 

    Improving the multi-step fabrication approach of copper nanofiber networks based transparent electrode for achieving superb conductivity and transparency

    , Article Materials Research Express ; Volume 6, Issue 9 , 2019 ; 20531591 (ISSN) Mohamadbeigi, N ; Angizi, S ; Sadrnezhaad, S. K ; Nikzad, M. J ; Sharif University of Technology
    Institute of Physics Publishing  2019
    Abstract
    Transparent Conductive Electrode (TCE), as an essential part of the optoelectronic devices, has become popular owing to its unique properties such as high optical transmittance and conductivity. Among utilized materials for fabrication of TCE, copper nanofibers (NFs)-network have been attracting much attention due to its extraordinary properties such as low sheet resistance, the scalable manufacturing and low-cost fabrication method. However, many challenges exist in the way of multi-step fabrication of network to increase the NFs continuity and consequently, improvement of their electrical conductivity as TCE. Herein, we report a deep investigation of the effective parameters on diameter... 

    Optoelectronic properties of thermally coated tin selenide thin films for photovoltaics

    , Article International Journal of Energy Research ; 2021 ; 0363907X (ISSN) Ali, N ; Sharif, U ; Shahzad, N ; Kalam, A ; Al-Sehemi, A ; Alrobei, H ; Khesro, A ; Sharif University of Technology
    John Wiley and Sons Ltd  2021
    Abstract
    In this study, 490 nm thin tin selenide thin films were deposited by facile co-evaporation techniques using Sn and Se sources on a clean glass substrate. The thin films were annealed at moderate annealing temperature followed by characterization and analysis. The thin annealed films possess polycrystalline nature and orthorhombic structure with an average grain size of 130 nm. The band gap assessed from absorption spectra for the highly annealed sample was 1.52 eV. The resistivity and sheet resistance were measured with four-probe techniques and the sheet resistance was =1.362 × 104 ohm for the highly annealed film. © 2021 John Wiley & Sons Ltd  

    Optoelectronic properties of thermally coated tin selenide thin films for photovoltaics

    , Article International Journal of Energy Research ; 2021 ; 0363907X (ISSN) Ali, N ; Sharif, U ; Shahzad, N ; Kalam, A ; Al-Sehemi, A ; Alrobei, H ; Khesro, A ; Sharif University of Technology
    John Wiley and Sons Ltd  2021
    Abstract
    In this study, 490 nm thin tin selenide thin films were deposited by facile co-evaporation techniques using Sn and Se sources on a clean glass substrate. The thin films were annealed at moderate annealing temperature followed by characterization and analysis. The thin annealed films possess polycrystalline nature and orthorhombic structure with an average grain size of 130 nm. The band gap assessed from absorption spectra for the highly annealed sample was 1.52 eV. The resistivity and sheet resistance were measured with four-probe techniques and the sheet resistance was =1.362 × 104 ohm for the highly annealed film. © 2021 John Wiley & Sons Ltd  

    An area and power optimization technique for CMOS bandgap voltage references

    , Article Analog Integrated Circuits and Signal Processing ; Volume 62, Issue 2 , 2010 , Pages 131-140 ; 09251030 (ISSN) Tajalli, A ; Chahardori, M ; Khodaverdi, A ; Sharif University of Technology
    2010
    Abstract
    This article explores the main tradeoffs in design of power and area efficient bandgap voltage reference (BGR) circuits. A structural design methodology for optimizing the silicon area and power dissipation of CMOS BGRs will be introduced. For this purpose, basic equations of the bandgap circuit have been adapted such that can simply be applied in the optimization process. To improve the reliability of the designed circuit, the effect of amplifier offset has been also included in the optimization process. It is also shown that the minimum achievable power consumption and area are highly depending on the fabrication process parameters especially sheet resistivity of the available resistors in...