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    Thermodynamic evaluation of adsorption of zinc complex and ZnO nano-layer prepared by tscd method based on langmuir adsorption model

    , Article International Journal of Engineering, Transactions B: Applications ; Volume 22, Issue 2 , 2009 , Pages 179-184 ; 1728-144X (ISSN) Vaezi, M. R ; Sadrnezhaad, S. K ; Sharif University of Technology
    Materials and Energy Research Center  2009
    Abstract
    Zinc oxide thin films were deposited on soda-lime glass substrates from an aqueous zinc- containing complex by two-stage chemical deposition (TSCD) method. Longmuir adsorption model showed that the adsorption of atoms on the surface of the substrate was typically physical. The relation between the fractional coverage, θ, with the equilibrium constant of the adsorption reaction was nonlinear indicating that the adsorption was non-ideal. The percentage of porosity, 1-θ, of the thin layer was determined as a function of Zn 2+ concentration of the solution. By application of XRD technique, it was shown that pure crystalline ZnO of controllable thickness could be deposited by TSCD method on the... 

    A Study on Optoelectronic Properties of Copper Zinc Tin Sulfur Selenide: A Promising Thin-Film Material for Next Generation Solar Technology

    , Article Crystal Research and Technology ; Volume 56, Issue 7 , 2021 ; 02321300 (ISSN) Ali, N ; Zubair, M ; Khesro, A ; Ahmed, R ; Uddin, S ; Shahzad, N ; Alrobei, H ; Kalam, A ; Al-Sehemi, A. G ; Ul Haq, B ; Sharif University of Technology
    John Wiley and Sons Inc  2021
    Abstract
    Studies on copper zinc tin sulpher selenide (CZTSSe) thin-film material and its applications as a base material are intensively being researched since it is an earth-abundant, inexpensive, flexible, and interesting material for next-generation optoelectronic technologies. Apropos, this study explores and reports the synthesis of CZTSSe thin films and their key optoelectronics characteristics. The reported films are fabricated on a soda-lime glass substrate by using a physical vapor deposition technique, and then annealed from 250 to 450 °C. From the X-ray diffraction analysis, the structure of the as-deposited thin films is found to be amorphous in nature. Annealed thin films of CZTSSe... 

    A study on optoelectronic properties of copper zinc tin sulfur selenide: A promising thin-film material for next generation solar technology

    , Article Crystal Research and Technology ; Volume 56, Issue 7 , 2021 ; 02321300 (ISSN) Ali, N ; Zubair, M ; Khesro, A ; Ahmed, R ; Uddin, S ; Shahzad, N ; Alrobei, H ; Kalam, A ; Al Sehemi, A. G ; Ul Haq, B ; Sharif University of Technology
    John Wiley and Sons Inc  2021
    Abstract
    Studies on copper zinc tin sulpher selenide (CZTSSe) thin-film material and its applications as a base material are intensively being researched since it is an earth-abundant, inexpensive, flexible, and interesting material for next-generation optoelectronic technologies. Apropos, this study explores and reports the synthesis of CZTSSe thin films and their key optoelectronics characteristics. The reported films are fabricated on a soda-lime glass substrate by using a physical vapor deposition technique, and then annealed from 250 to 450 °C. From the X-ray diffraction analysis, the structure of the as-deposited thin films is found to be amorphous in nature. Annealed thin films of CZTSSe... 

    Nanomechanical properties of TiO2 granular thin films

    , Article ACS Applied Materials and Interfaces ; Volume 2, Issue 9 , 2010 , Pages 2629-2636 ; 19448244 (ISSN) Yaghoubi, H ; Taghavinia, N ; Keshavarz Alamdari, E ; Volinsky, A.A ; Sharif University of Technology
    2010
    Abstract
    Post-deposition annealing effects on nanomechanical properties of granular TiO2 films on soda-lime glass substrates were studied. In particular, the effects of Na diffusion on the films' mechanical properties were examined. TiO2 photocatalyst films, 330 nm thick, were prepared by dip-coating using a TiO2 sol, and were annealed between 100 °C and 500 °C. Film's morphology, physical and nanomechanical properties were characterized by atomic force microscopy, X-ray photoelectron spectroscopy, X-ray diffraction, differential thermo-gravimetric analysis, and nanoindentation. Contrary to expectations, the maximum film hardness was achieved for 300°C annealing, with a value of 0.69 ± 0.05 GPa....