Sharif Digital Repository

In this paper, two Low cost and Soft Error Hardened latches (referred to as LSEH1 and LSEH2) are proposed and evaluated. The proposed latches are fully SEU immune, i.e. they are capable of tolerating all particle strikes to any of their nodes. Moreover, they can mask Single Event Transients (SETs) occurring in combinational logics and reaching the input of the latches. We have compared our SEU/SET-tolerant latches with some well-known previously proposed soft error tolerant latches. To evaluate the proposed latches, we have done a set of SPICE simulations. The simulation results trough comparisons with other hardened latches reveal that the proposed latches not only have more robustness but... 

One of the most prominent issues in fully adiabatic circuits is the breaking reversibility problem; i.e., non-adiabatic energy dissipation in the last stage adiabatic gates whose outputs are connected to external circuits. In this paper, we show that the breaking reversibility problem can result in significant energy dissipation. Subsequently, we propose an efficient technique to address the breaking reversibility problem, which is applicable to the usual fully adiabatic logic such as 2LAL, SCRL, and RERL. Detailed SPICE simulations are used to evaluate the proposed technique. The experimental results show that the proposed technique can considerably reduce (e.g., about 74% for RERL, 35% for... 

Communication channels in Network-on-Chips (NoCs) are highly susceptible to crosstalk faults due to the use of nano-scale VLSI technologies in the fabrication of NoCs. Crosstalk faults cause variable timing delay in NoC channels based on the patterns of transitions appearing on the channels. This paper proposes an analytical model to estimate the timing delay of an NoC channel in the presence of crosstalk faults. The model calculates expected number of 4C, 3C, 2C, and 1C transition patterns to predict delay of a K-bit communication channel. The model is applicable for both non-protected channels and channels which are protected by crosstalk mitigation methods. Spice simulations are done in a... 

With the emergence of various battery operated technologies in different computing domains and the challenge of heating in such technologies, the issue of energy dissipation has become more critical than ever before. In such systems, energy constraints in one hand, and heat generation, on the other hand, necessitates the employment of energy efficient technologies in the fabrication of digital circuits. One possible solution for mitigating the energy dissipation in digital circuits is the use of adiabatic families in the process of designing computing devices. Adiabatic circuits are designed mainly based on the principles of thermodynamics and provide a paradigm shift in the design of... 

This article proposes a high-voltage fault current limiter (HVFCL) for high-voltage dc power supplies (HVdcPSs) which limits the current of the power supply automatically in the short-circuit fault (SCF). The proposed HVFCL is based on the series-connected insulated gate bipolar transistors (IGBTs). The main achievements of this article are the balanced voltage sharing and a very low value of the short-circuit current near to the load nominal current for the series-connected IGBTs during the SCF. These achievements result in a longer maximum permissible short-circuit time. These achievements are obtained by a control strategy that puts the series-connected IGBTs in a specific operating point... 

Given the importance of reducing energy consumption and the challenge of heat generation in classic CMOS circuits, adiabatic circuits are believed as an appropriate alternative. Most of the adiabatic circuit families come with a dual-rail structure, which provides them with an inherent hardware redundancy. Although this redundancy could be used for improving their reliability, no studies have been previously conducted to exploit this feature. In this regard, in this paper, we show that by exploiting the inherent hardware redundancy in adiabatic circuits, their reliability could be improved, while imposing a relatively low amount of energy overhead. Subsequently, with utilizing the outcome... 

This paper proposes a Numeral-Based Crosstalk Avoidance Coding (NB-CAC) to protect communication channels of Network-on-Chips (NoCs) against crosstalk faults. The NB-CAC scheme produces codewords without bit patterns '101' and '010' to eliminate harmful transition patterns from NoC channels. This is done by the use of a new numeral system proposed in the paper. Using the proposed numeral system, the NB-CAC scheme 1) can be utilized in NoC channels with any arbitrary width, and 2) can be implemented with low area, power, and timing overheads. VHDL and SPICE simulations have been carried out for a wide range of channel widths to evaluate delay, area, and power consumption of the NB-CAC codecs.... 

A high-power short-pulse generator based on the dual action of two coupled diodes, a high-voltage step recovery diode and a high-current diode, is presented. This is made possible using a gas discharge tube. Both analysis and SPICE simulation show about 20-dB peak power increment. This gives a high output power level of 5.7 MW with 1-ns pulsewidth and 450-kHz repetition rate obtained from an input average power of 7.1 kW. An efficiency of about 73% is obtained with more than 30 dB increase in the average power delivered to a 50-Ω load  

Embedded systems account for wide range of applications. However, the design of such systems is faced with a diverse spectrum of criteria. The energy consumption, performance, and demanding security concerns are some of the most significant challenges in designing of such systems. With these challenges, the design process can be managed more easily if a flexible logic circuit with the ability of satisfying the abovementioned concerns is taken into account. To achieve such a logic circuit, in this paper we have combined the sub-threshold operation and charge recovery techniques. Using our technique, lower power consumption, ability of operating at higher frequencies, and more security (to... 

High reliability against noise, high performance, and low energy consumption are key objectives in the design of on-chip networks. Recently some researchers have considered the impact of various error-control schemes on these objectives and on the tradeoff between them. In all these works performance and reliability are measured separately. However, we will argue in this paper that the use of error-control schemes in on-chip networks results in degradable systems, hence, performance and reliability must be measured jointly using a unified measure, i.e., performability. Based on the traditional concept of performability, we provide a definition for the "Interconnect Performability".... 

Single event upsets (SEUs) and single event transients (SETs) are major reliability concerns in deep submicron technologies. As technology feature size shrinks, digital circuits are becoming more susceptible to SEUs and SETs. A novel SEU/SET-tolerant latch called feedback redundant SEU/SET-tolerant latch (FERST) is presented, where redundant feedback lines are used to mask SEUs and delay elements are used to filter SETs. Detailed SPICE simulations have been done to evaluate the proposed design and compare it with previous latch designs. The results show that the SEU tolerance of the FERST latch is almost equal to that of a TMR latch (a widely used latch which is the most reliable among the... 

Scaling transistor size to the scale of the nanometer coupled with reduction of supply voltage has made SRAMs more vulnerable to soft errors than ever before. The vulnerability has been accentuated by increased variability in device parameters. In this paper, we present an analytical model for critical charge in order to assess the soft error vulnerability of 6T SRAM cell. The model takes into account the dynamic behavior of the cell and demonstrates a simple technique to decouple the nonlinearly coupled storage nodes. Decoupling of storage nodes enables solving associated current equations to determine the critical charge for an exponential noise current. The critical charge model thus...