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    A Low-Cost highly reliable spintronic true random number generator circuit for secure cryptography

    , Article SPIN ; Volume 10, Issue 1 , 2020 Alibeigi, I ; Amirany, A ; Rajaei, R ; Tabandeh, M ; Shouraki, S. B ; Sharif University of Technology
    World Scientific Publishing Co. Pte Ltd  2020
    Abstract
    Generation of random numbers is one of the most important steps in cryptographic algorithms. High endurance, high performance and low energy consumption are the attractive features offered by the Magnetic Tunnel Junction (MTJ) devices. Therefore, they have been considered as one of the promising candidates for next-generation digital integrated circuits. In this paper, a new circuit design for true random number generation using MTJs is proposed. Our proposed circuit offers a high speed, low power and a truly random number generation. In our design, we employed two MTJs that are configured in special states. Generated random bit at the output of the proposed circuit is returned to the write... 

    Threshold characteristics analysis of InP-based PhC VCSEL with buried tunnel junction

    , Article 2013 21st Iranian Conference on Electrical Engineering ; May , 2013 , Page(s): 1 - 4 ; 9781467356343 (ISBN) Marjani, S ; Hosseini, S. E ; Faez, R ; Sharif University of Technology
    2013
    Abstract
    The comprehensive optical-electrical-gain-thermal self-consistent model of the 1.55 μm AlGaInAs Photonic Crystal vertical cavity surface emitting diode lasers (PhC VCSELs) with buried tunnel junction (BTJ) has been applied to optimize its threshold characteristics. It shows that, for 5 μm devices, the room temperature (RT) threshold current equal to only 0.59 mA and maximum operating temperature equal to as much as 380 K. Results suggest that, the 5 μm AlGaInAs PhC VCSELs seem to be the most optimal ones for light sources in high performance optical communication systems  

    Formation of clusters in the 2D t-J model: The mechanism for phase separation

    , Article Journal of Physics Condensed Matter ; Volume 18, Issue 20 , 2006 , Pages 4935-4944 ; 09538984 (ISSN) Fledderjohann, A ; Langari, A ; Mutter, K. H ; Sharif University of Technology
    2006
    Abstract
    The emergence of phase separation is investigated in the framework of a 2D t-J model by means of a variational product ansatz, which covers the infinite lattice by two types of L × L clusters. Clusters of the first type are completely occupied with electrons, i.e. they carry maximal charge Qe = L2 and total spin 0, and thereby form the antiferromagnetic background. Holes occur in the second type of clusters - called 'hole clusters'. They carry a charge Qh0.5) it turns out that hole clusters are occupied with an even... 

    A High Performance MRAM Cell Through Single Free-Layer Dual Fixed-Layer Magnetic Tunnel Junction

    , Article IEEE Transactions on Magnetics ; Volume 58, Issue 12 , 2022 ; 00189464 (ISSN) Alibeigi, I ; Tabandeh, M ; Shouraki, S. B ; Patooghy, A ; Rajaei, R ; Sharif University of Technology
    Institute of Electrical and Electronics Engineers Inc  2022
    Abstract
    As technology size scales down, magnetic tunnel junctions (MTJs) as a promising technology are becoming more and more sensitive to process variation, especially in oxide barrier thickness. Process variation particularly affects the cell resistance and the critical switching current for the smaller dimensions. This article proposes an MTJ cell with one free and two pinned layers, which highly improves the process variation robustness. By employing the spin transfer torque (STT)-spin-Hall effect (SHE) switching method, our proposed MTJ cell improves the switching speed and lowers the switching power consumption. Per simulations, an MRAM cell built with the proposed MTJ cell offers up to 36%... 

    A silicon doped hafnium oxide ferroelectric p-n-p-n SOI tunneling field-effect transistor with steep subthreshold slope and high switching state current ratio

    , Article AIP Advances ; Volume 6, Issue 9 , 2016 ; 21583226 (ISSN) Marjani, S ; Hosseini, S. E ; Faez, R ; Sharif University of Technology
    American Institute of Physics Inc  2016
    Abstract
    In this paper, a silicon-on-insulator (SOI) p-n-p-n tunneling field-effect transistor (TFET) with a silicon doped hafnium oxide (Si:HfO2) ferroelectric gate stack is proposed and investigated via 2D device simulation with a calibrated nonlocal band-to-band tunneling model. Utilization of Si:HfO2 instead of conventional perovskite ferroelectrics such as lead zirconium titanate (PbZrTiO3) and strontium bismuth tantalate (SrBi2Ta2O9) provides compatibility to the CMOS process as well as improved device scalability. By using Si:HfO2 ferroelectric gate stack, the applied gate voltage is effectively amplified that causes increased electric field at the tunneling junction and reduced tunneling...