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Modeling and Control of Atomic Force Microscope Based Nanoparticle Manipulation

Babahosseini, Hesam | 2010

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  1. Type of Document: M.Sc. Thesis
  2. Language: Farsi
  3. Document No: 40408 (08)
  4. University: Sharif University of Technology
  5. Department: Mechanical Engineering
  6. Advisor(s): Meghdari, Ali
  7. Abstract:
  8. In the recent years, there has been great interest in exploring methods for assembly and manipulation at the micro/nanoscale to build miniaturized systems, devices, structures, and machines. This thesis aims at two-dimensional manipulation of nanoparticle using Atomic Force Microscope (AFM) probe. The nanoprobe is used to push the spherical micro/nanoparticle. Continuum based modeling and simulation of the manipulation task is presented. The proposed nanomanipulation model consists of all effective phenomena in nanoscale. Nanoscale interaction forces, elastic deformation in contact areas, and friction forces in tip/nanoparticle/substrate system are considered. The utilized friction models are a modified Coulomb model and Lund-Grenoble (LuGre) model. The simulations are included a pushing based nanoparticle manipulation task on a desired path of a flat substrate and a stepped substrate. In the simulation results, nanoscale interaction forces between /nanoparticle/substrate, elastic deformation in contact areas, the position of the nanoparticle over time, and dynamic of AFM during a nanomanipulation process are recorded. The primary contribution of this thesis is that the modeling and simulation have enhanced understanding of the particle behavior and the interaction forces during micro/nanomanipulation. Also, the simulation results show the upper and lower bound of AFM pushing force versus variation of systems parameters in the manipulation of a nanoparticle on the stepped substrate. In the second section of this thesis, control of nanoparticle manipulation process for accomplishment of a precise and effective nanomanipulation task is studied in order to achieve the main goal of full automatic nanomanipulation system without direct intervention of an operator. The first control aim is control and positioning the microcantilever tip at a desired trajectory especially at a constant height above the sample substrate during lateral nanomanipulation by the control input force which can be exerted on the microcantilever in the z direction by a piezo actuator located in the base of the microcantilever. The second control target is PZT-driven positioning stage in AFM-based nanomanipulation with considering substrate roughness. The simulation results show that the designed controllers have been able to make the desired variable state to track specified trajectory during a nanoscale manipulation.

  9. Keywords:
  10. Atomic Force Microscopy (AFM) ; Elastic Deformation ; Nanomanipulation ; Nano-Particle Dynamics ; Stepped Substrate ; Nanoscale Interaction Force ; Lund-Grenoble (LuGre)Friction Model ; Modified Coulomb Friction Model

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