Investigation of Surface Segregation Phenomenon in Thin Films, Ph.D. Dissertation Sharif University of Technology ; Iraji zad, Azam (Supervisor)
Abstract
In this thesis, substrate surface segregation during thin film deposition and also during heat treatment has been investigated. For this purpose, surface segregation of copper substrate has been studied in some thin layer systems and the results revealed that surface segregation is possible in more unexpected situations. Complete studies of Ni/Cu system were investigated in UHV condition and direct measurement of surface energy as the main controlling parameter of surface segregation was done using contact angle measurements. The results indicated that in V2O5/Cu system, surface segregation of the Cu occurred up to oxide thickness of 200 nm. The Cu surface segregation in the electrodeposited...
Cataloging briefInvestigation of Surface Segregation Phenomenon in Thin Films, Ph.D. Dissertation Sharif University of Technology ; Iraji zad, Azam (Supervisor)
Abstract
In this thesis, substrate surface segregation during thin film deposition and also during heat treatment has been investigated. For this purpose, surface segregation of copper substrate has been studied in some thin layer systems and the results revealed that surface segregation is possible in more unexpected situations. Complete studies of Ni/Cu system were investigated in UHV condition and direct measurement of surface energy as the main controlling parameter of surface segregation was done using contact angle measurements. The results indicated that in V2O5/Cu system, surface segregation of the Cu occurred up to oxide thickness of 200 nm. The Cu surface segregation in the electrodeposited...
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