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Statistical Analysis of Parameter Fluctuation on Performance of Giga Scale Integration

Asghari Shirvani, Rouzbeh | 2011

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  1. Type of Document: M.Sc. Thesis
  2. Language: Farsi
  3. Document No: 44229 (05)
  4. University: Sharif University of Technology
  5. Department: Electrical Engineering
  6. Advisor(s): Sarvari, Reza
  7. Abstract:
  8. Developing to the sub-micron dimentions reduces the size of integrated circuits, so interconnects and a variations in their characteristics has more effects on circuit performance. Worst case study is the most common method in these systems, but in many cases interconnect lines are independent from eachother. Analysis state that worst case is out of the distribution in many cases (with zero possibility) and result in a pessimistic design. Statistical analysis should replace worst case analysis in multi varient systems. In this titile, statistical analysis will be used to investigate performance of interconnects in new technology. Maximum variation in interconnect parameters are considered and these variations are assumed to be normal or guassian. Statistical analysis method shows that worst case in parameter, puts the worst case delay to out of distribution, so worst case analysis will result in a lower efficiency. As a result , by reducing feature size of devices designers need to replace worst case analysis with new methods like statistical analysis in order to implement more complex functions with a chip of similiar dimentions and they can consider process variations at the same time
  9. Keywords:
  10. Statistical Analysis ; Worst Case Analysis ; Interconnect Process Variations ; Interconnect Delay ; Repeators

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