Statistical Analysis of Parameter Fluctuation on Performance of Giga Scale Integration, M.Sc. Thesis Sharif University of Technology ; Sarvari, Reza (Supervisor)
Abstract
Developing to the sub-micron dimentions reduces the size of integrated circuits, so interconnects and a variations in their characteristics has more effects on circuit performance. Worst case study is the most common method in these systems, but in many cases interconnect lines are independent from eachother. Analysis state that worst case is out of the distribution in many cases (with zero possibility) and result in a pessimistic design. Statistical analysis should replace worst case analysis in multi varient systems. In this titile, statistical analysis will be used to investigate performance of interconnects in new technology. Maximum variation in interconnect parameters are considered...
Cataloging briefStatistical Analysis of Parameter Fluctuation on Performance of Giga Scale Integration, M.Sc. Thesis Sharif University of Technology ; Sarvari, Reza (Supervisor)
Abstract
Developing to the sub-micron dimentions reduces the size of integrated circuits, so interconnects and a variations in their characteristics has more effects on circuit performance. Worst case study is the most common method in these systems, but in many cases interconnect lines are independent from eachother. Analysis state that worst case is out of the distribution in many cases (with zero possibility) and result in a pessimistic design. Statistical analysis should replace worst case analysis in multi varient systems. In this titile, statistical analysis will be used to investigate performance of interconnects in new technology. Maximum variation in interconnect parameters are considered...
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