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| 2013

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Type of Document: M.Sc. Thesis
Language: Farsi
Document No: 45256 (05)
University: Sharif University of Technology
Department: Electrical Engineering
Advisor(s): Sarvari, Reza; Fardmanesh, Mehdi
Abstract:
As technology scales down Integrated Circuits operates at higher frequency and lower dimensions. Interconnects inside these chips operate at gigahertz frequencies and manometer range. As mean free path of electrons become comparable with wire dimensions and skin depth, first one will result in Size Effect and second one will result in Anomalous Skin Effect. In this thesis we are trying to characterize these effects. The MFP of electron for copper at room temperature is about 38nm and therefore neither Size effect nor ASE are measurable at room temperature with our available equipment. Hence, the idea is to measure ASE for copper wires at liquid nitrogen temperature (77K). We showed that ASE can be observed at about 10GHz frequency. We reported our measurements, problems and suggested method for further characterization
Keywords:
Size Effect ; Transmission Lines ; Thin Films ; Interconnect Network ; Anomalous Skin Effect

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