Numerical Investigation of Dewetting of Evaporating thin Films over Nanometric Topography, M.Sc. Thesis Sharif University of Technology ; Moosavi, Ali (Supervisor)
Abstract
Evaporation and condensation of thin films can rupture or stabilize thin film .We show that evaporation hastens dewetting of a thin film. Dewetting over nanometric downward step causes pinning of the contact line near the step. This phenomena is not permanent and after certain time that contact angle reaches to its critical value depinnnig happens. We also study the effect of the step size, contact angle, film thickness, slip and evaporation on the depinning time of the contact line. We show that depinnig time has a reverse relation with the rate of evaporation
Cataloging briefNumerical Investigation of Dewetting of Evaporating thin Films over Nanometric Topography, M.Sc. Thesis Sharif University of Technology ; Moosavi, Ali (Supervisor)
Abstract
Evaporation and condensation of thin films can rupture or stabilize thin film .We show that evaporation hastens dewetting of a thin film. Dewetting over nanometric downward step causes pinning of the contact line near the step. This phenomena is not permanent and after certain time that contact angle reaches to its critical value depinnnig happens. We also study the effect of the step size, contact angle, film thickness, slip and evaporation on the depinning time of the contact line. We show that depinnig time has a reverse relation with the rate of evaporation
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