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Dewetting of evaporating thin films over nanometer-scale topographies

Akbarzadeh, A. M ; Sharif University of Technology

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  1. Type of Document: Article
  2. DOI: 10.1103/PhysRevE.90.012409
  3. Abstract:
  4. A lubrication model is used to study dewetting of an evaporating thin film layer over a solid substrate with a nanometer-scale topography. The effects of the geometry of the topography, the contact angle, the film thickness, and the slippage on the dewetting have been studied. Our results reveal that the evaporation enhances the dewetting process and reduces the depinning time over the topography. Also it is shown that the depinning time is inversely proportional to the slippage and increasing the contact angle may considerably reduce the depinning time, while the film thickness increases the depinning time
  5. Keywords:
  6. Contact angle ; Film thickness ; Thin films ; De-wetting ; Depinning ; Dewetting process ; Lubrication models ; Nano-meter-scale ; Solid substrates ; Thin film layers ; Topography
  7. Source: Physical Review E - Statistical, Nonlinear, and Soft Matter Physics ; Vol. 90, issue. 1 , July , 2014 ; ISSN: 15393755
  8. URL: http://journals.aps.org/pre/abstract/10.1103/PhysRevE.90.012409