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Eye diagram parameter extraction of nano scale VLSI interconnects
Mehri, M ; Sharif University of Technology | 2012
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- Type of Document: Article
- DOI: 10.1109/EPEPS.2012.6457908
- Publisher: 2012
- Abstract:
- In this paper, jitter due to both capacitive and inductive coupling is studied. Maximum frequency of driving signal on a wire is limited by its input rise time, fall time, pulse width, and the coupling effect from its neighbors. The analytical expressions to estimate the deterministic jitter time due to these effects are presented. The estimation is based on the fastest and slowest approximation of the signal waveform components. Also, we have extracted the eye opening parameters of the eye diagram. The inductance effects significance is shown on eye opening and jitter time. The 45nm technology is used for estimating the horizontal and vertical eye opening and jitter time. The presented formula is compared with the simulations for some cases and it shows good agreements
- Keywords:
- Eye diagram ; Eye opening ; VLSI Interconnect ; 45nm technology ; Analytical expressions ; Capacitive and inductive couplings ; Coupling effect ; Deterministic jitters ; Driving signal ; Eye diagrams ; Eye openings ; Fall time ; Inductance effects ; Input rise time ; Jitter-time ; Jittre ; Maximum frequency ; Nano-scale VLSI ; Pulsewidths ; Signal waveform ; VLSI interconnects ; Electromagnetic induction ; Electronics packaging ; Estimation ; Interconnection networks ; Jitter ; Parameter extraction ; Integrated circuit testing
- Source: 2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012 ; 2012 , Pages 327-330 ; 9781467325394 (ISBN)
- URL: http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=6457908&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D6457908