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Cooperative hybrid ARQ in solar powered wireless sensor networks

Jalali, F ; Sharif University of Technology | 2012

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  1. Type of Document: Article
  2. DOI: 10.1016/j.microrel.2012.07.009
  3. Publisher: 2012
  4. Abstract:
  5. Energy harvesters are used in today's Wireless Sensor Networks (WSNs) to harvest energy from the environment. Although an energy harvester can provide a supply source with a much greater lifetime than a battery, the amount of available energy for an energy harvesting system is a random variable. Furthermore, the proper management of energy harvesters has a considerable impact on reliability. It has been observed that cooperative error control mechanisms like Cooperative Automatic Repeat Request (C-ARQ) and Cooperative Hybrid ARQ (C-HARQ) can be used for improving the energy management and reliability in Energy Harvesting WSNs (EH-WSNs). Recently, the impact of C-ARC mechanism has been considered in an energy harvesting system (GAP4S), however, GAP4S is an EH-WSN powered by microwave with linear recharge rate and unbounded storage capacity. This work evaluates the effect of C-HARC using a new method of relay node selection in EH-WSNs which are powered by the solar energy and have variable recharge rates. Furthermore, a comparative study of C-ARQ and C-HARQ mechanisms, considering the impact of variations in transmission rate and packet error probability on the energy consumption, is provided. The results show that C-HARQ outperforms C-ARQ under the same conditions and the energy consumption of a relay node in C-HARQ is 50% less than the one in C-ARQ
  6. Keywords:
  7. Automatic repeat request ; Available energy ; Comparative studies ; Energy Harvester ; Energy harvesting systems ; Error control ; Hybrid ARQ ; Packet error probability ; Recharge rates ; Relay node ; Relay node selections ; Solar-powered wireless sensor networks ; Storage capacity ; Supply sources ; Transmission rates ; Wireless sensor network (WSNs) ; Energy harvesting ; Energy utilization ; Sensor nodes ; Data communication systems
  8. Source: Microelectronics Reliability ; Volume 52, Issue 12 , 2012 , Pages 3043-3052 ; 00262714 (ISSN)
  9. URL: http://www.sciencedirect.com/science/article/pii/S0026271412003599