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High quality factor RF inductors using low loss conductor featured with skin effect suppression for standard CMOS/BiCMOS

Iramnaaz, I ; Sharif University of Technology | 2011

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  1. Type of Document: Article
  2. DOI: 10.1109/ECTC.2011.5898508
  3. Publisher: 2011
  4. Abstract:
  5. Integrated on-chip inductors with high quality factors are demonstrated using a low loss artificial conductor technology. This concept is based on an artificial layered meta-material comprising a bi-layered Ni 80Fe 20/Cu superlattice. By properly tailoring the thickness ratio between the non-magnetic and magnetic metallic layers, the skin effects can be effectively suppressed within a wide frequency range, and can be tuned to a minimum at the frequency of interest up to 67 GHz. The quality factor has been increased by 41% of a 2nH inductor at 14.5GHz. The bandwidth of skin effect suppression is obtained between 10-18 GHz
  6. Keywords:
  7. High quality factors ; Low loss ; Magnetic metallic layers ; Nonmagnetics ; Onchip inductors ; Quality factors ; RF inductors ; Standard CMOS ; Thickness ratio ; Wide frequency range ; Electric conductors ; Metamaterials ; Skin effect
  8. Source: Proceedings - Electronic Components and Technology Conference, 31 May 2011 through 3 June 2011 ; June , 2011 , Pages 163-168 ; 05695503 (ISSN) ; 9781612844978 (ISBN)
  9. URL: http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5898508