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Evaluation of effective resistances in pseudo-distance-regular resistor networks
Jafarizadeh, S ; Sharif University of Technology | 2010
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- Type of Document: Article
- DOI: 10.1007/s10955-009-9909-8
- Publisher: 2010
- Abstract:
- The effective resistance or two-point resistance between two nodes of a resistor network is the potential difference that appears across them when a unit current source is applied between the nodes as terminals. This concept arises in problems which deal with graphs as electrical networks including random walks, distributed detection and estimation, sensor networks, distributed clock synchronization, collaborative filtering, clustering algorithms and etc. In the previous paper (Jafarizadeh et al. in J. Math. Phys. 50:023302, 2009) a recursive formula for evaluation of effective resistances on the so-called distance-regular networks was given based on the Christoffel-Darboux identity. In this paper, we consider more general networks called pseudo-distance-regular networks or QD type networks, where we use the stratification of these networks and show that the effective resistances between a given node, say α, and all of the nodes β belonging to the same stratum with respect to α, are the same. Then, based on the spectral techniques, for those α,β's which satisfy Lαα -1 = Lββ -1 (L-1 is the pseudo-inverse of the Laplacian of the network), an analytical formula for effective resistances Rαβ(m)(the equivalent resistance between terminals α and β, so that β belongs to the m-th stratum with respect to α) is given in terms of the first and second orthogonal polynomials associated with the network. From the fact that in distance-regular networks, Lαα -1 = Lββ -1 is satisfied for all nodes α,β of the network, the effective resistances Rαβ(m) for m=1, 2,..., d (d is diameter of the network which is the same as the number of strata) are calculated directly, by using the given formula
- Keywords:
- Effective resistance ; Pseudo-distance-regular networks ; Spectral distribution ; Stratification
- Source: Journal of Statistical Physics ; Volume 139, Issue 1 , 2010 , Pages 177-199 ; 00224715 (ISSN)
- URL: http://link.springer.com/article/10.1007%2Fs10955-009-9909-8