Loading...

THz non-destructive testing for covered defects

Panahi, O ; Sharif University of Technology | 2017

584 Viewed
  1. Type of Document: Article
  2. DOI: 10.1109/MMWaTT.2016.7869913
  3. Publisher: Institute of Electrical and Electronics Engineers Inc , 2017
  4. Abstract:
  5. In this paper, a pulsed THz imaging system in normal geometry is presented experimentally and the effect of placing a pinhole in front of a covered sample on image quality has been investigated too. Also, the improvement of image quality by using ray transfer matrix is described theoretically. Finally, by using contour system the results are evaluated and the accuracy of THz imaging system is tested. © 2016 IEEE
  6. Keywords:
  7. Defect ; Photoconductive antenna ; Ray transfer matrix ; THz imaging ; Defects ; Image quality ; Imaging systems ; Millimeter waves ; Nondestructive examination ; Ray tracing ; Transfer matrix method ; Non destructive testing ; Photoconductive antennas ; Ray-transfer matrix ; THz imaging ; Terahertz waves
  8. Source: 4th International Conference on Millimeter-Wave and Terahertz Technologies, MMWaTT 2016, 20 December 2016 through 22 December 2016 ; 2017 , Pages 45-47 ; 21570965 (ISSN); 9781509054145 (ISBN)
  9. URL: https://ieeexplore.ieee.org/document/7869913