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Thermal noise analysis of multi-bit SC gain-stages for low-voltage high-resolution pipeline ADC design

Azizi, M. Y ; Sharif University of Technology | 2003

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  1. Type of Document: Article
  2. DOI: 10.1109/SCS.2003.1227119
  3. Publisher: Institute of Electrical and Electronics Engineers Inc , 2003
  4. Abstract:
  5. Analysis of thermal noise in switched-capacitor multi-bit gain-stages used in low-voltage high-resolution pipeline analog-to-digital converters is presented. The analytical expression obtained for the input referred noise power, which should be considered in the design procedure, is general for any number of bits being resolved and shows that the noise power is decreased when more bits are resolved in the stage. © 2003 IEEE
  6. Keywords:
  7. Analog to digital conversion ; Pipelines
  8. Source: International Symposium on Signals, Circuits and Systems, SCS 2003, 10 July 2003 through 11 July 2003 ; Volume 2 , 2003 , Pages 581-584 ; 0780379799 (ISBN); 9780780379794 (ISBN)
  9. URL: https://ieeexplore.ieee.org/document/5731352