Hybrid finite-element method-molecular dynamics approach for modelling of non-contact atomic force microscopy imaging

Pishkenari, H. N ; Sharif University of Technology | 2011

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  1. Type of Document: Article
  2. DOI: 10.1049/mnl.2011.0173
  3. Publisher: 2011
  4. Abstract:
  5. Models capable of accurate simulation of the microcantilever dynamics coupled with complex tip-sample interactions are essential for interpretation of the imaging results in non-contact atomic force microscopy (AFM). In the present research, a combination of finite element and molecular dynamics methods are used for modelling the AFM system to overcome the drawbacks of conventional approaches that use a lumped system with van der Waals interaction. To illustrate the ability of the proposed scheme in providing images with atomic resolution, some simulations have been performed. In the conducted simulations, a diamond tip is interacting with nickel samples having different surface plane directions. The results demonstrate the effectiveness of the proposed modelling method for measuring the surface topography with appropriate contrast and atomic details
  6. Keywords:
  7. AFM ; Atomic resolution ; Conventional approach ; Diamond tip ; Finite Element ; Lumped system ; Micro-cantilevers ; Modelling method ; Molecular dynamics methods ; Noncontact atomic force microscopy ; Surface planes ; Tip-sample interaction ; Van Der Waals interactions ; Computer simulation ; Dynamics ; Finite element method ; Surface topography ; Van der Waals forces ; Atomic force microscopy ; Nickel ; Controlled study ; Finite element analysis ; Molecular dynamics ; Molecular interaction ; Process design ; Surface property
  8. Source: Micro and Nano Letters ; Volume 6, Issue 6 , June , 2011 , Pages 412-416 ; 17500443 (ISSN)
  9. URL: http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=5960461&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D5960461