Soft error rate estimation of digital circuits in the presence of Multiple Event Transients (METs)

Fazeli, M ; Sharif University of Technology | 2011

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  1. Type of Document: Article
  2. Publisher: 2011
  3. Abstract:
  4. In this paper, we present a very fast and accurate technique to estimate the soft error rate of digital circuits in the presence of Multiple Event Transients (METs). In the proposed technique, called Multiple Event Probability Propagation (MEPP), a four-value logic and probability set are used to accurately propagate the effects of multiple erroneous values (transients) due to METs to the outputs and obtain soft error rate. MEPP considers a unified treatment of all three masking mechanisms i.e., logical, electrical, and timing, while propagating the transient glitches. Experimental results through comparisons with statistical fault injection confirm accuracy (only 2.5% difference) and speed-up (10,000X faster) of MEPP
  5. Keywords:
  6. Event probability ; Fault injection ; Logic and probability ; Soft error rate ; Soft error rate estimations ; Speed-ups ; Digital integrated circuits ; Probabilistic logics ; Transients ; Power quality
  7. Source: Proceedings -Design, Automation and Test in Europe, DATE, 14 March 2011 through 18 March 2011 ; March , 2011 , Pages 70-75 ; 15301591 (ISSN) ; 9783981080179 (ISBN)
  8. URL: http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=5763020&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D5763020