Effects of higher oscillation modes on TM-AFM measurements

Pishkenari, H. N ; Sharif University of Technology

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  1. Type of Document: Article
  2. DOI: 10.1016/j.ultramic.2010.10.015
  3. Abstract:
  4. The finite element method and molecular dynamics simulations are used for modeling the AFM microcantilever dynamics and the tip-sample interaction forces, respectively. Molecular dynamics simulations are conducted to calculate the tip-sample force data as a function of tip height at different lateral positions of the tip with respect to the sample. The results demonstrate that in the presence of nonlinear interaction forces, higher eigenmodes of the microcantilever are excited and play a significant role in the tip and sample elastic deformations. Using comparisons between the results of FEM and lumped models, how some aspects of the system behavior can be hidden when the point-mass model is used is illustrated
  5. Keywords:
  6. Finite element method ; Higher order oscillations ; Molecular dynamics simulations ; TM-AFM ; AFM ; Eigen modes ; Higher order ; Lumped models ; Mass models ; Micro-cantilevers ; Nonlinear interactions ; Oscillation mode ; System behaviors ; Tip-sample forces ; Tip-sample interaction ; Atomic force microscopy ; Composite micromechanics ; Dynamics ; Mathematical models ; Molecular dynamics ; accuracy ; Amplitude modulation ; Equilibrium constant ; Finite element analysis ; High frequency oscillation ; Intermethod comparison ; Mathematical computing ; Mathematical model ; Measurement error ; Prediction ; Process model ; Microscopy, Atomic Force ; Molecular Dynamics Simulation ; Nanotechnology ; Nonlinear Dynamics
  7. Source: Ultramicroscopy ; Volume 111, Issue 2 , 2011 , Pages 107-116 ; 03043991 (ISSN)
  8. URL: http://www.sciencedirect.com/science/article/pii/S0304399110002731