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Fault-tolerance improvement of planar adaptive routing based on detailed traffic analysis

Shamaei, A ; Sharif University of Technology | 2007

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  1. Type of Document: Article
  2. DOI: 10.1109/ISCIS.2007.4456897
  3. Publisher: 2007
  4. Abstract:
  5. Currently, some coarse measures like global network latency are used to compare routing protocols. These measures do not provide enough insight of traffic distribution among network nodes in the presence of different fault regions. This paper presents a detailed traffic analysis of fault-tolerant planar adaptive routing (FTPAR) algorithm achieved by an especially developed tool. Per-node traffic analysis illustrates the traffic hotspots caused by fault regions and provides a great assistance in developing fault tolerant routing algorithms. Based on such detailed information, a simple yet effective improvement of FTPAR is suggested. Moreover, the effect of a traffic hotspot on the traffic of neighboring nodes and global performance degradation is investigated. To analyze the per-node traffic, some per-node traffic metrics are introduced and one of them is selected for the rest of work. In an effort to gain deep understanding of the issue of traffic analysis of faulty networks, this paper is the first attempt to investigate per-node traffic around fault regions. ©2007 IEEE
  6. Keywords:
  7. Adaptive algorithms ; Communication ; Cybernetics ; Fault tolerance ; Information management ; Information science ; Network routing ; Quality assurance ; Reliability ; Routing protocols ; Sulfate minerals ; Adaptive routing ; Fault tolerances ; Fault-tolerant routing ; Fault-tolerant ; Global networks ; Global performance ; Hotspot ; Hotspots ; International symposium ; Metrics ; Neighboring nodes ; Network nodes ; Traffic analysis ; Traffic distributions ; Routing algorithms ; Fault-tolerant planar adaptive routing (FTPAR)
  8. Source: 22nd International Symposium on Computer and Information Sciences, ISCIS 2007, Ankara, 7 November 2007 through 9 November 2007 ; 2007 , Pages 408-412 ; 1424413648 (ISBN); 9781424413645 (ISBN)
  9. URL: https://ieeexplore.ieee.org/document/4456897