Search for: basic-elements
A low cost circuit level fault detection technique to full adder design, Article 2011 18th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2011, 11 December 2011 through 14 December 2011, Beirut ; 2011 , Pages 446-450 ; 9781457718458 (ISBN) ; Fazeli, M ; Hessabi, S ; Miremadi, S. G ; Sharif University of Technology
This paper proposes a Low Cost circuit level Fault Detection technique called LCFD for a one-bit Full Adder (FA) as the basic element of adder circuits. To measure the fault detection coverage of the proposed technique, we conduct an exhaustive circuit level fault injection experiment on all susceptible nodes of a FA. Experimental results show that the LCDF technique can detect about 83% of injected faults while having only about 40% area and 22% power consumption overheads. In the LCDF technique, the fault detection latency does not affect the latency of the FA, since the error detection is done in parallel with the addition
On a new formulation of microphenomena: Basic principles, stationary fields and beyond, Article Pramana - Journal of Physics ; Volume 76, Issue 6 , 2011 , Pages 843-873 ; 03044289 (ISSN) ; Sharif University of Technology
In a series of essays, beginning with this article, we are going to develop a new formulation of microphenomena based on the principles of reality and causality. The new theory provides us with a new depiction of microphenomena assuming a unified concept of information, matter and energy. So, we suppose that in a definite microphysical context (including other interacting particles), each particle is enfolded by a probability field whose existence is contingent on the existence of the particle, but it can locally affect the physical status of the particle in a context-dependent manner. The dynamics of the whole particle-field system obeys deterministic equations in a manner such that when...