Loading...
Search for:
chaos-application
0.005 seconds
A New Method for Measuring very Low Variation in Physical Parameters based on the Sensitivity to Conditions of Chaotic Systems
, M.Sc. Thesis Sharif University of Technology ; Zohoor, Hasan (Supervisor)
Abstract
Since the beginning of human civilization, improving the methods of measuring and identifying changes in order to improve the level of comfort and safety of human civilization is inevitable. The intrinsic property of high sensitivity to system conditions in chaos phenomena has led some researchers to use this feature for purposes of identifying and measuring changes. The most important bugs of previous researches in this area are the complexity, lack of coherence and dependence on the nominal parameters. By analyzing the effect of the type and magnitude of the initial deviation in a system parameter on all the characteristics of the Duffing system response in the chaotic regime, was observed...