Sharif Digital Repository

With the emergence of various battery operated technologies in different computing domains and the challenge of heating in such technologies, the issue of energy dissipation has become more critical than ever before. In such systems, energy constraints in one hand, and heat generation, on the other hand, necessitates the employment of energy efficient technologies in the fabrication of digital circuits. One possible solution for mitigating the energy dissipation in digital circuits is the use of adiabatic families in the process of designing computing devices. Adiabatic circuits are designed mainly based on the principles of thermodynamics and provide a paradigm shift in the design of... 

In recent years, high availability and reliability of data storage systems (DSS) have been significantly threatened by soft errors occurring in storage controllers. Due to their specific functionality and hardware-software stack, error propagation and manifestation in DSS is quite different from general-purpose computing architectures. To the best of our knowledge, no previous study has examined the system-level effects of soft errors on the availability and reliability of DSS. In this paper, we first analyze the effects of soft errors occurring in the server processors of storage controllers on the entire storage system dependability. To this end, we implement the major functions of a... 

The flexibility of software-based fault tolerant approaches in providing the required level of reliability Commer-cial-Off-The Shelf (COTS) devices made them the first choice in designing safety-critical systems. In this paper, we propose a reliability improvement method for COTS-based systems, so-called, RI-COTS. The main idea behind RI-COTS is to establish a tradeoff between reliability and performance of COTS system through controlling redundant execution at instruction level. RI-COTS is implemented on LEON2 processor VHDL model. Our simulation results show that comparing with the most related studies, RI-COTS can improve the fault detection capability by 20% with only 4% performance... 

This paper proposes a full-featured fault injection framework to assess reliability of FPGA-based designs. The framework provides non-intrusiveness, portability, flexibility and performance in reliability evaluation of FPGA-based designs against adverse effects of SEUs. It works in a non-intrusive manner, allowing the reliability of ready-to-be-released designs to be assessed independently, without any intrusion into their place and route characteristics. We have studied implications of framework's intrusiveness into design under test by comparing proposed non-intrusive framework with previous intrusive methods; up to 5% deviation in the number of effective faults is observed in intrusive... 

This paper presents a Data Width-aware Register file Protection (DWRP) technique to cope with Multiple Bit Upsets (MBUs) occurring in the register file of embedded processors. The DWRP technique has been proposed based on the fact that there are often a significant number of bits in the register file, which are not fully occupied by data. The DWRP technique efficiently exploits these available free bits for reliability enhancement purposes. In this regard, every register is equipped with three extra tag bits to specify the amount of available free bits in a register. Then the appropriate parity or hamming code is used based on the information of the tag field to protect the register file... 

Fast, accurate, and detailed Soft Error Rate (SER) estimation of digital circuits is essential for cost-efficient reliable design. A major step to accurately estimate a circuit SER is the computation of failure probability, which requires the computation of three derating factors, namely logical, electrical, and timing derating. The unified treatment of these derating factors is crucial to obtain accurate failure probability. Existing SER estimation techniques are either unscalable to large circuits or inaccurate due to lack of unified treatment of all derating factors. In this paper, we present fast and efficient algorithms to estimate SERs of circuit components in the presence of single... 

In this paper, we have proposed a fast and easy-to-develop FPGA-based fault injection technique. This technique uses the Altera FPGAs debugging facilities in order to inject SEU fault model in both flip-flops and memory units. Since this method uses the FPGAs built-in facilities, it imposes a negligible performance and area overhead on the system. The experimental results on Leon2 processor shows that the proposed technique is on average four orders of magnitude faster than a simulation-based fault injection  

This paper proposes a Low Cost circuit level Fault Detection technique called LCFD for a one-bit Full Adder (FA) as the basic element of adder circuits. To measure the fault detection coverage of the proposed technique, we conduct an exhaustive circuit level fault injection experiment on all susceptible nodes of a FA. Experimental results show that the LCDF technique can detect about 83% of injected faults while having only about 40% area and 22% power consumption overheads. In the LCDF technique, the fault detection latency does not affect the latency of the FA, since the error detection is done in parallel with the addition  

The vulnerability of microprocessors to soft errors is increasing due to continuous shrinking in fabrication process. Recent studies show that 1-5% of the SEUs (single event upset) can cause MBUs (multiple bit upsets). The probability of MBU generation due to SEU is increasing because of the reduction in minimum energy required to flip a memory bit in modern technologies. Register file is the most sensitive component in a microprocessor. In this paper, we present an innovative way to protect registers in a 64-bit register file for a RISC processor using extended Hamming (8, 4) code (SEC-DED code) and narrow-width values. A narrow-width value can be represented by half number of bits of the... 

We propose a roll-forward error recovery technique based on multiple scan chains for TMR systems, called Scan chained TMR (ScTMR). ScTMR reuses the scan chain flip-flops employed for testability purposes to restore the correct state of a TMR system in the presence of transient or permanent errors. In the proposed ScTMR technique, we present a voter circuitry to locate the faulty module and a controller circuitry to restore the system to the fault-free state. As a case study, we have implemented the proposed ScTMR technique on an embedded processor, suited for safety-critical applications. Exhaustive fault injection experiments reveal that the proposed architecture has the error detection and... 

In this paper, we present a very fast and accurate technique to estimate the soft error rate of digital circuits in the presence of Multiple Event Transients (METs). In the proposed technique, called Multiple Event Probability Propagation (MEPP), a four-value logic and probability set are used to accurately propagate the effects of multiple erroneous values (transients) due to METs to the outputs and obtain soft error rate. MEPP considers a unified treatment of all three masking mechanisms i.e., logical, electrical, and timing, while propagating the transient glitches. Experimental results through comparisons with statistical fault injection confirm accuracy (only 2.5% difference) and... 

In this paper, we propose a very fast analytical approach to measure the overall circuit Soft Error Rate (SER) and to identify the most vulnerable gates and flip-flops. In the proposed approach, we first compute the error propagation probability from an error site to primary outputs as well as system bistables. Then, we perform a multi-cycle error propagation analysis in the sequential circuit. The results show that the proposed approach is four to five orders of magnitude faster than the Monte Carlo (MC) simulation-based fault injection approach with 92% accuracy. This makes the proposed approach applicable to industrial-scale circuits  

Fault injection methods have been used for analyzing dependability characteristics of systems for years. In this paper we propose a practical mixed-signal fault injection flow that is fast as well as accurate. We described three classes of most common faults: i) Single event transients, ii) Electro-Magnetic interference and iii) Power disturbance faults. Fault models are implemented directly into circuit's devices using behavioral fault description in Verilog-A language. As an example for dependability evaluation, some test circuits have been prepared and the results of fault injection on their designs have been reported  

Over the past few years, radiation-induced transient errors, also referred to as soft errors, have been a severe threat to the data integrity of high-end and mainstream processors. Recent studies show that cache memories are among the most vulnerable components to soft errors within high-performance processors. Accurate modeling of the Vulnerability Factor (VF) is an essential step towards developing cost-effective protection techniques for cache memory. Although Fault Injection (FI) techniques can provide relatively accurate VF estimations they are often very time consuming. To overcome the limitation, recent analytical models were proposed to compute the cache VF in a timely fashion. In... 

While the Control Flow Checking (CFC) methods are using the ordinary instruction set and general Arithmetic and Logic Unit (ALU) features to protect the programs against the transient faults, this paper presents a new kind of CFC method, called feature specific CFC. The idea behind this method is using a specific internal hardware in modern processors which provides the ability to monitor internal various parameters of the program. This method is a pure software method and the external hardware overhead is zero. Other overheads have been measured experimentally by executing the workloads on a Pentium system. The execution time overhead is between 42% and 67% and the program size overhead is... 

Soft errors due to cosmic radiations are the main reliability threat during lifetime operation of digital systems. Fast and accurate estimation of soft error rate (SER) is essential in obtaining the reliability parameters of a digital system in order to balance reliability, performance, and cost of the system. Previous techniques for SER estimation are mainly based on fault injection and random simulations. In this paper, we present an analytical SER modeling technique for ASIC designs that can significantly reduce SER estimation time while achieving very high accuracy. This technique can be used for both combinational and sequential circuits. We also present an approach to obtain... 

In this paper, we propose a very fast and accurate analytical approach to estimate the overall SER and to identify the most vulnerable gates,flip-flops, and paths of a circuit. Using such information, designers can selectively protect the vulnerable parts resulting in lower power and area overheads that are the most important factors in embedded systems. Unlike previous approaches, the proposed approach firstly does not rely on fault injection or fault simulation; secondly it measures the SER for multi cycles of circuit operation; thirdly, the proposed approach accurately computes all three masking factors, namely, logical, electrical, and timing masking; fourthly, the effects of error... 

Nowadays, communication protocols are used in safety-critical automotive applications. In these applications, fault tolerance is a main requirement and the existence of single points of failure is a serious threat to system failures. Among the communication protocols, FlexRay is expected to become the communication backbone for future automotive systems. In this paper, we identify single points of failure in the FlexRay protocol by injecting a total of 135,600 single-bit transient faults into all accessible registers of the FlexRay communication controller. The results showed that about 1.2% of all injected faults caused the controller to freeze immediately. Based on these results and... 

FlexRay communication protocol is expected becoming the de-facto standard for distributed safetycritical systems. In this paper, transient single bit-flip faults were injected into the FlexRay communication controller to categorize and analyze the activatedfaults. In this protocol, an activated fault results in one or more error types which are Boundary violation, Conflict, Content, Freeze, Synchronization, and Syntax. To study the activated faults, a FlexRay bus network, composed of four nodes, was modeled by Verilog HDL; and a total of 135,600 transient faults were injected in only one node, where 9,342 (6.9%) of the faults were activated. The results show that the Synchronization error is... 

In many synchronous digital systems especially those used in mobile applications, the system is exposed to sever shaking that may lead to a failure in the clock generator. In this paper we present an effective method to tolerate the faults on the clock signal that are due to defects in external oscillators. Our technique utilizes no Phase-Lock Loops (PLL), no Delay-Locked Loops (DLL) and no high frequency oscillators because of their drawbacks so that it needs neither more effort to meet Electro-Magnetic Compatibility (EMC) and requirements nor extra hardware to implement DLLs. We have formally evaluated the meta-stability of our technique. This evaluation shows that our technique reliably...