Sharif Digital Repository

By technology down scaling in nowadays digital circuits, their sensitivity to radiation effects increases, making the occurrence of soft errors more probable. As a consequence, soft error rate estimation of complex circuits such as processors is becoming an important issue in safety- and mission-critical applications. Fault injection is a well-known and widely used approach for soft error rate estimation. Development of previous FPGA-based fault injection techniques is very time consuming mainly because they do not adequately exploit supplementary FPGA tools. This paper proposes an easy-to-develop and flexible FPGA-based fault injection technique. This technique utilizes debugging facilities... 

A potential peculiarity of software systems is that a large number of soft-errors are inherently derated (masked) at the software level. The rate of error-deration may depend on the type of algorithms and data structures used in the software. This paper investigates the effects of the underlying algorithms of programs on the rate of error-deration. Eight different benchmark programs were used in the study; each of them was implemented by four different algorithms, i.e. divide-and-conquer, dynamic, backtracking and branch-and-bound. About 10,000 errors were injected into each program in order to quantify and analyze the error-derating capabilities of different algorithm-designing- techniques.... 

This paper proposes a full-featured fault injection framework to assess reliability of FPGA-based designs. The framework provides non-intrusiveness, portability, flexibility and performance in reliability evaluation of FPGA-based designs against adverse effects of SEUs. It works in a non-intrusive manner, allowing the reliability of ready-to-be-released designs to be assessed independently, without any intrusion into their place and route characteristics. We have studied implications of framework's intrusiveness into design under test by comparing proposed non-intrusive framework with previous intrusive methods; up to 5% deviation in the number of effective faults is observed in intrusive... 

This paper presents a Data Width-aware Register file Protection (DWRP) technique to cope with Multiple Bit Upsets (MBUs) occurring in the register file of embedded processors. The DWRP technique has been proposed based on the fact that there are often a significant number of bits in the register file, which are not fully occupied by data. The DWRP technique efficiently exploits these available free bits for reliability enhancement purposes. In this regard, every register is equipped with three extra tag bits to specify the amount of available free bits in a register. Then the appropriate parity or hamming code is used based on the information of the tag field to protect the register file... 

Fast, accurate, and detailed Soft Error Rate (SER) estimation of digital circuits is essential for cost-efficient reliable design. A major step to accurately estimate a circuit SER is the computation of failure probability, which requires the computation of three derating factors, namely logical, electrical, and timing derating. The unified treatment of these derating factors is crucial to obtain accurate failure probability. Existing SER estimation techniques are either unscalable to large circuits or inaccurate due to lack of unified treatment of all derating factors. In this paper, we present fast and efficient algorithms to estimate SERs of circuit components in the presence of single... 

In this paper, we have proposed a fast and easy-to-develop FPGA-based fault injection technique. This technique uses the Altera FPGAs debugging facilities in order to inject SEU fault model in both flip-flops and memory units. Since this method uses the FPGAs built-in facilities, it imposes a negligible performance and area overhead on the system. The experimental results on Leon2 processor shows that the proposed technique is on average four orders of magnitude faster than a simulation-based fault injection  

This paper proposes an efficient concurrent error detection method using control flow checking for embedded processors. The proposed method is based on the co-operation of two hardware modules: 1) an on-chip hardware component to detect branch instructions and generate signatures for the running program, and 2) an external watchdog processor to compare runtime signatures and branch addresses with the information extracted offline. The proposed method is implemented on an embedded processor core and is evaluated by a simulation based statistical fault injection approach where faults are injected into cache and main memory. Experimental results show that the proposed method detects more than... 

This paper proposes a Low Cost circuit level Fault Detection technique called LCFD for a one-bit Full Adder (FA) as the basic element of adder circuits. To measure the fault detection coverage of the proposed technique, we conduct an exhaustive circuit level fault injection experiment on all susceptible nodes of a FA. Experimental results show that the LCDF technique can detect about 83% of injected faults while having only about 40% area and 22% power consumption overheads. In the LCDF technique, the fault detection latency does not affect the latency of the FA, since the error detection is done in parallel with the addition  

The vulnerability of microprocessors to soft errors is increasing due to continuous shrinking in fabrication process. Recent studies show that 1-5% of the SEUs (single event upset) can cause MBUs (multiple bit upsets). The probability of MBU generation due to SEU is increasing because of the reduction in minimum energy required to flip a memory bit in modern technologies. Register file is the most sensitive component in a microprocessor. In this paper, we present an innovative way to protect registers in a 64-bit register file for a RISC processor using extended Hamming (8, 4) code (SEC-DED code) and narrow-width values. A narrow-width value can be represented by half number of bits of the... 

We propose a roll-forward error recovery technique based on multiple scan chains for TMR systems, called Scan chained TMR (ScTMR). ScTMR reuses the scan chain flip-flops employed for testability purposes to restore the correct state of a TMR system in the presence of transient or permanent errors. In the proposed ScTMR technique, we present a voter circuitry to locate the faulty module and a controller circuitry to restore the system to the fault-free state. As a case study, we have implemented the proposed ScTMR technique on an embedded processor, suited for safety-critical applications. Exhaustive fault injection experiments reveal that the proposed architecture has the error detection and... 

In this paper, we present a very fast and accurate technique to estimate the soft error rate of digital circuits in the presence of Multiple Event Transients (METs). In the proposed technique, called Multiple Event Probability Propagation (MEPP), a four-value logic and probability set are used to accurately propagate the effects of multiple erroneous values (transients) due to METs to the outputs and obtain soft error rate. MEPP considers a unified treatment of all three masking mechanisms i.e., logical, electrical, and timing, while propagating the transient glitches. Experimental results through comparisons with statistical fault injection confirm accuracy (only 2.5% difference) and... 

In this paper, we propose a very fast analytical approach to measure the overall circuit Soft Error Rate (SER) and to identify the most vulnerable gates and flip-flops. In the proposed approach, we first compute the error propagation probability from an error site to primary outputs as well as system bistables. Then, we perform a multi-cycle error propagation analysis in the sequential circuit. The results show that the proposed approach is four to five orders of magnitude faster than the Monte Carlo (MC) simulation-based fault injection approach with 92% accuracy. This makes the proposed approach applicable to industrial-scale circuits  

Fault injection methods have been used for analyzing dependability characteristics of systems for years. In this paper we propose a practical mixed-signal fault injection flow that is fast as well as accurate. We described three classes of most common faults: i) Single event transients, ii) Electro-Magnetic interference and iii) Power disturbance faults. Fault models are implemented directly into circuit's devices using behavioral fault description in Verilog-A language. As an example for dependability evaluation, some test circuits have been prepared and the results of fault injection on their designs have been reported  

Over the past few years, radiation-induced transient errors, also referred to as soft errors, have been a severe threat to the data integrity of high-end and mainstream processors. Recent studies show that cache memories are among the most vulnerable components to soft errors within high-performance processors. Accurate modeling of the Vulnerability Factor (VF) is an essential step towards developing cost-effective protection techniques for cache memory. Although Fault Injection (FI) techniques can provide relatively accurate VF estimations they are often very time consuming. To overcome the limitation, recent analytical models were proposed to compute the cache VF in a timely fashion. In... 

While the Control Flow Checking (CFC) methods are using the ordinary instruction set and general Arithmetic and Logic Unit (ALU) features to protect the programs against the transient faults, this paper presents a new kind of CFC method, called feature specific CFC. The idea behind this method is using a specific internal hardware in modern processors which provides the ability to monitor internal various parameters of the program. This method is a pure software method and the external hardware overhead is zero. Other overheads have been measured experimentally by executing the workloads on a Pentium system. The execution time overhead is between 42% and 67% and the program size overhead is... 

FlexRay communication protocol is expected to become the de-facto standard for distributed safety-critical systems. This paper classifies the effects of transient single bit-flip fault injections into the FlexRay communication controller. In this protocol, when an injected fault is activated, this may result in one or more error types, i.e.: Boundary violation, Conflict, Content, Freeze, Synchronization, Syntax, and Invalid frame. To study the activated faults, a FlexRay bus network, composed of four nodes, was modeled by Verilog HDL; and a total of 135,600 transient faults was injected in only one node, called the target node. The results show that only 9,342 of the faults (about 6.9%) were... 

Soft errors due to cosmic radiations are the main reliability threat during lifetime operation of digital systems. Fast and accurate estimation of soft error rate (SER) is essential in obtaining the reliability parameters of a digital system in order to balance reliability, performance, and cost of the system. Previous techniques for SER estimation are mainly based on fault injection and random simulations. In this paper, we present an analytical SER modeling technique for ASIC designs that can significantly reduce SER estimation time while achieving very high accuracy. This technique can be used for both combinational and sequential circuits. We also present an approach to obtain... 

Use of deep sub-micron VLSI technologies in fabrication of Network on Chips (NoCs) makes the reliability to be one of the first order concerns in the design of these products. This paper proposes and evaluates a methodology that adds reliability to NoC routing algorithms with minimal power and performance overheads. The key idea behind this methodology is to use the concept of complement routing in which two routing algorithms with disjoint sets of allowed turns are incorporated. According to this methodology, while a packet is routed by a routing algorithm, a redundant copy of that packet is routed by the complement of that routing algorithm. This is done by exploiting channels with lower... 

In this paper, we propose a very fast and accurate analytical approach to estimate the overall SER and to identify the most vulnerable gates,flip-flops, and paths of a circuit. Using such information, designers can selectively protect the vulnerable parts resulting in lower power and area overheads that are the most important factors in embedded systems. Unlike previous approaches, the proposed approach firstly does not rely on fault injection or fault simulation; secondly it measures the SER for multi cycles of circuit operation; thirdly, the proposed approach accurately computes all three masking factors, namely, logical, electrical, and timing masking; fourthly, the effects of error...