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Single Event Multiple Upset (SEMU) tolerant latch designs in presence of process and temperature variations
Rajaei, R

Cataloging brief

Single Event Multiple Upset (SEMU) tolerant latch designs in presence of process and temperature variations
Author :   Rajaei, R
Publisher :   World Scientific Publishing Co. Pte Ltd
Pub. Year  :   2015
Subjects :   Process and temperature variation Single event multiple effect Soft error tolerant latch...
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