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Multifractal and optical bandgap characterization of Ta2O5 thin films deposited by electron gun method
Shakoury, R

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Multifractal and optical bandgap characterization of Ta2O5 thin films deposited by electron gun method
Author :   Shakoury, R
Publisher :   Springer
Pub. Year  :   2020
Subjects :   Atomic force microscopy Electron gun method Multifractal analysis Atomic force...
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