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Simulation of imaging in tapping-mode atomic-force microscopy: a comparison amongst a variety of approaches
Nejat Pishkenari, H ; Sharif University of Technology
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- Type of Document: Article
- DOI: 10.1088/0022-3727/44/7/075303
- Abstract:
- Models capable of accurate simulation of microcantilever dynamics coupled with complex tip–sample interactions are essential for interpretation and prediction of the imaging results in amplitude modulation or tapping-mode atomic-force microscopy (AM-AFM or TM-AFM). In this paper, four approaches based on combinations of lumped and finite element methods for modelling of cantilever dynamics, and van der Waals and molecular dynamics for modelling of tip–sample interactions, are used to simulate the precise imaging by AM-AFM. Based on the simulated imaging and force determination, the efficiency of different modelling schemes is evaluated. This comparison is performed considering their coincidence with the realistic behaviour of AM-AFM in imaging of nanoscale features. In the conducted simulations, a diamond tip is used to scan a C60 molecule absorbed on a graphite substrate. The effects of amplitude set-point, cantilever stiffness and quality factor on the accuracy of different modelling approaches are studied
- Keywords:
- Surfaces ; Interfaces and thin films
- Source: Journal of Physics D: Applied Phyics ; Vol.44, Number 7, p.1-9, 2011
- URL: http://iopscience.iop.org/0022-3727/44/7/075303