Physical Fault Injection Methods for Evaluation of Embedded Processors

Please enable javascript in your browser.

Shabahang, Soha | 2015

569 Viewed

Type of Document: M.Sc. Thesis
Language: Farsi
Document No: 48011 (19)
University: Sharif University of Technology
Department: Computer Engineering
Advisor(s): Hemmatyar, Ali Mohammad Afshin
Abstract:
In order to ensure the Immunity of integrated circuits against electromagnetic interference, integrated circuits should go under the sensitivity measurement test. This test consists of radiation or directly injecting electromagnetic interference. Injected disturbances are applied, either to the whole device or to one part of the device under test. Standard 62132 describes the specification of the methods for determining the sensitivity in frequencies between 150 kHz to 1 GHz. To provide a method which is capable of implementing and is controllable, it is necessary to study the standard models, and examine and discuss the strengths and weaknesses of each from the point of performance and functionality. This study selects the most efficient and reliable method by evaluation of the previous methods, and after removing some of the restrictions, simulates and implements the chosen method. After implementation of direct power injection, the results of this test are compared with simulation results obtained from different integrated circuit technologies
Keywords:
Immunization ; Electromagnetic Interference (EMI) ; Embedded Processor ; Device Under Test ; Susceptibility Level ; Near Field Injection

No TOC