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Simultaneous Measurement of Refractive Index and Physical Thickness Using Fourier-Domain Optical Coherence Tomography

Moazami Gudarzi, Nilufar | 2017

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  1. Type of Document: M.Sc. Thesis
  2. Language: Farsi
  3. Document No: 50050 (04)
  4. University: Sharif University of Technology
  5. Department: Physics
  6. Advisor(s): Amjadi, Ahmad
  7. Abstract:
  8. In Fourier domain optical coherence tomography, we can measure the optical thickness (refractive index n times thickness d), of sample’s layers. In this work, we introduce a new method for measurement of refractive index and physical thickness of multiple layers simultaneously by Fourier domain optical coherence tomography, without additional information about the structure of the sample under investigation. The input data to the formulation are the optical path lengths (OPLs) and suitable set of wavenumber of the FD-OCT interference spectrum. The output of simulation suggest that, the accuracy of the extracted parameters depend on the difference in the refractive index gradient of sample interfaces and independent of physical thickness. Furthermore, we show that the accuracy of the extracted parameters can be affected by uncertainty in obtained OPLs. So, we introduce a method to optimize the accuracy of parameters in spite of uncertainty in measuring OPLs
  9. Keywords:
  10. Optical Coherence Tomography ; Refractive Index ; Fourier Domain ; Physical Thickness ; Multilayer Systems

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