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A New Method for Measuring very Low Variation in Physical Parameters based on the Sensitivity to Conditions of Chaotic Systems
Seddighi Renani, Jamal | 2017
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- Type of Document: M.Sc. Thesis
- Language: Farsi
- Document No: 50534 (08)
- University: Sharif University of Technology
- Department: Mechanical Engineering
- Advisor(s): Zohoor, Hasan
- Abstract:
- Since the beginning of human civilization, improving the methods of measuring and identifying changes in order to improve the level of comfort and safety of human civilization is inevitable. The intrinsic property of high sensitivity to system conditions in chaos phenomena has led some researchers to use this feature for purposes of identifying and measuring changes. The most important bugs of previous researches in this area are the complexity, lack of coherence and dependence on the nominal parameters. By analyzing the effect of the type and magnitude of the initial deviation in a system parameter on all the characteristics of the Duffing system response in the chaotic regime, was observed that the divergence exponent that indicates the severity of the sensitivity to the system conditions is dependent on the type of initial deviation and system conditions. Therefore, this feature was used to detect a small change in the damping ratio of the studied Duffing system under the influence of error in measuring the initial condition of the system and the initial excitation phase. Also, the effect of noise on the proposed method was studied and the method was extended to other chaos systems
- Keywords:
- Change Detection ; Chaotic System ; Chaos Application ; Sensitivity to System Conditions ; Divergence Exponent ; High Sensitive Sensor
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